Abstract:To meet the stringent requirements of next-generation film capacitors for power electronics, multilayer films (MLFs) are fabricated with the advantage of achieving high temperature rating, high energy density, and reasonably low loss simultaneously. In this study, a high permittivity polar polymer, poly(vinylidene fluoride) (PVDF), is multilayered with a linear, low loss dielectric polymer such as high-temperature polycarbonate (HTPC). However, the dielectric loss of these MLFs was still high as compared with current state-of-the-art biaxially oriented polypropylene (BOPP) films. The goal of this work is to decrease the dielectric loss and enhance dielectric insulation by achieving flat-on primary PVDF crystals in MLFs via nanoconfined melt-recrystallization. Based on simultaneous small- and wide-angle X-ray scattering experiments, edge-on lamellar crystals were observed for all as-extruded MLFs, regardless of different PVDF layer thicknesses. However, after melting at 180 °C followed by recrystallization, flat-on primary crystals were successfully achieved when the PVDF layer thickness was below 39 nm. Above 78 nm for the PVDF layer, major edge-on primary crystals with minor flat-on secondary crystals were observed. From leakage current, breakdown, lifetime, and electric displacement-electric field loop studies, MLFs with the flat-on primary crystals exhibited reduced loss and enhanced dielectric insulation as compared to as-extruded MLFs and those with edge-on primary/flat-on secondary crystals. This was attributed to the effective blockage of charge carriers by the flat-on PVDF primary crystals and their reduced ferroelectric switching.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsami.0c15457?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsami.0c15457</a>.Melt viscosities of HTPC and PVDF, dielectric lifetime measurement scheme, 1D SAXS profiles, ATR FTIR and FESEM characterization results, DSC curves, frequency-scan BDS results for as-extruded and melt-recrystallized HTPC/PVDF 256L films, leakage current results for the HTPC/PVDF 256L films at various electric fields and temperatures (<a class="ext-link" href="/doi/suppl/10.1021/acsami.0c15457/suppl_file/am0c15457_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.

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