An Influence of Mechanical Stresses on the Magnitude of the Internal Field in Lead Zirconate Titanate Thin Films

A. R. Valeeva,E. Yu. Kaptelov,S. V. Senkevich,I. P. Pronin,S. A Nemov,V. P. Pronin
DOI: https://doi.org/10.1134/s1063785023010327
2024-03-15
Technical Physics Letters
Abstract:In self-polarized lead zirconate titanate thin films formed on platinized silicon substrates, a significant increase in the internal electric field was observed as a result of long-term aging. To explain this phenomenon, a mechanism is proposed for the formation of the internal field associated with the diffusion of charged oxygen vacancies, which, in turn, is due to the action of a mechanical stress gradient. The diffusion coefficient of charged oxygen vacancies was estimated to be ~ 3 × 10 –16 cm 2 /s.
physics, applied
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