Mechanical polishing with chemical passivation of perovskite single crystal for high-performance X-ray detector

Wenqing Zhang,Hu Wang,Hao Dong,Fenghua Li,Zhiyuan Wang,Yuchuan Shao
DOI: https://doi.org/10.1039/d2tc03850a
IF: 6.4
2022-11-03
Journal of Materials Chemistry C
Abstract:High-quality and large-size perovskite single crystals are promising candidates for radiation detection due to outstanding optoelectronic properties. To meet the detector application, large-size crystal ingots need to be sliced and polished. However, the commonly used polishing agent generally corrodes the surface and introduces the defects during the polishing process. Here, we report a top-down method using an improved polishing agent, which does not bring in any major change in morphology. Furthermore, we combine mechanical polishing with chemical passivation to improve the crystal quality. Finally, the surface texture resulting from the etch or recrystallization by precursor solution could be efficiently removed. We achieve high performance radiation detectors based on high-quality and large-size MAPbBr 3 single crystals. The dark current and ion migration of MAPbBr 3 single crystal is significantly suppressed after surface treatment, which enhances the dark current stability over 10 hours. The superior properties enable us to realize a high-performance X-ray detector with the sensitivity of 21,897.44 μC Gy -1 cm -2 and the lowest detection limit of 25 nGy s -1 at 1V bias. Furthermore, a radiographic imaging with 1 mm spatial resolution is demonstrated at a dose rate about 100 nGy s -1 .
materials science, multidisciplinary,physics, applied
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