The Application of a Random Forest Classifier to ToF-SIMS Imaging Data

Mariya A. Shamraeva,Theodoros Visvikis,Stefanos Zoidis,Ian G. M. Anthony,Sebastiaan Van Nuffel
DOI: https://doi.org/10.1021/jasms.4c00324
IF: 3.262
2024-10-27
Journal of the American Society for Mass Spectrometry
Abstract:Time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging is a potent analytical tool that provides spatially resolved chemical information on surfaces at the microscale. However, the hyperspectral nature of ToF-SIMS datasets can be challenging to analyze and interpret. Both supervised and unsupervised machine learning (ML) approaches are increasingly useful to help analyze ToF-SIMS data. Random Forest (RF) has emerged as a robust and powerful algorithm for processing mass spectrometry...
chemistry, physical,spectroscopy, analytical,biochemical research methods
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