Inline edge illumination X-ray phase contrast imaging through mask misalignment

Nicholas Francken,Jonathan Sanctorum,Joaquim Sanctorum,Pieter-Jan Vanthienen,Jan Sijbers,Jan De Beenhouwer
DOI: https://doi.org/10.1364/oe.525730
IF: 3.8
2024-08-23
Optics Express
Abstract:Nicholas Francken, Jonathan Sanctorum, Joaquim Sanctorum, Pieter-Jan Vanthienen, Jan Sijbers, Jan De Beenhouwer X-ray imaging is becoming more commonplace for inline industrial inspection, where a sample placed on a conveyor belt is translated through ... [Opt. Express 32, 32048-32061 (2024)]
optics
What problem does this paper attempt to address?