Enhanced photogalvanic effect in Janus PtSSe-HfSSe lateral heterojunctions

Hong Li,Jiahui Li,Fengbin Liu,Kang An,Jing Lu
DOI: https://doi.org/10.1016/j.nxmate.2024.100116
2024-07-01
Next Materials
Abstract:The enhancement of photogalvanic effect (PGE) is vital for the application of optoelectronics. We use the ab initio quantum transport method to study the possible enhancement of PGE by importing a lateral PtSSe-HfSSe heterojunction. Under irradiation of linearly polarized light with photon energies (E ph) of 0.8–6.2 eV, the overall increase ratio of the PGE photocurrent is over 20/50 along the armchair/zigzag direction. The lateral PtSSe-HfSSe photodetector along the armchair direction exhibits a better photon response than the photodetector along the zigzag direction. The maximal PGE photocurrent is 42.26 a0 2/photon at E ph = 2.0 eV, and the highest extinction ratio is 2.5 × 104 at E ph = 1.6 eV. Our study indicates that the lateral PtSSe-HfSSe heterojunction is a favorable candidate for optoelectronics.
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