Integrated Silicon-on-Insulator Spectrometer With Single Pixel Readout for Mid-Infrared Spectroscopy

G. Roelkens,R. Baets,Jeroen Allaert,A. Vasiliev,J. Van Campenhout,M. Muneeb
DOI: https://doi.org/10.1109/JSTQE.2018.2820169
IF: 4.9
2018-03-28
IEEE Journal of Selected Topics in Quantum Electronics
Abstract:Mid-infrared spectroscopy in the 2–4 <inline-formula><tex-math notation="LaTeX">$\mu$</tex-math> </inline-formula>m wavelength range is of cardinal value for many sensing applications. Current solutions involve bulky and expensive systems to operate. Silicon-on-Insulator (SOI) waveguide technology offers means to miniaturize the different parts of the spectrometer. However, the development of on-chip detectors for the mid-infrared wavelength range is in its infancy and the characteristics are not on par with their discrete (cooled) counterparts. In this work, a compact and cheap mid-infrared spectrometer is realized by integrating a SOI arrayed waveguide grating (AWG) spectrometer operating in the 2.3 <inline-formula><tex-math notation="LaTeX">$\mu$</tex-math></inline-formula>m wavelength range with a high performance mid-infrared photodiode. The AWG has 12 output channels with a spacing of 225 GHz (4 nm) and a free spectral range of 3150 GHz (56 nm), which are simultaneously collected by a single, transistor outline (TO)-packaged extended InGaAs PIN photodiode. The response of each AWG channel is discerned by time-sequentially modulating the optical power in each output channel using integrated Mach-Zehnder based thermo-optic modulators with a <inline-formula><tex-math notation="LaTeX">$\pi$</tex-math></inline-formula>-phase shift power consumption of <inline-formula><tex-math notation="LaTeX">$\approx$</tex-math></inline-formula>50 mW. As an example, the absorption spectrum of a 0.5 mm thick polydimethylsiloxane sheet is sampled and compared to a benchtop spectrometer to good agreement.
Engineering,Physics,Materials Science
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