Abstract:The recently emerging digital image correlation (DIC)-assisted fringe projection profilometry (FPP) has been demonstrated to be superior in shape and deformation measurement on complex structures. But the contradictory demands on the reflectivity of tested surface between FPP and DIC extremely limit its measuring accuracy. In this work, chromatic DIC-assisted FPP is proposed to achieve accurate 3-D shape, deformation measurement, and strain analysis. First, colorful fluorescent pigment is introduced to fabricate speckle patterns, and the optimal fluorescent color is solved to simultaneously ensure high fringes intensity modulation and speckles’ chroma difference; then, the intensity-chroma space analysis method is presented to modulate and demodulate the projected fringe and fabricated speckle information in intensity and chroma space without interference. High-quality fringe and speckle patterns can be simultaneously obtained for accurate shape, deformation, and strain measurement. To the best of our knowledge, for the first time, it essentially overcomes inherent contradictions between FPP and DIC on the requirement of surface reflectivity. Finally, the chain rule is introduced to further complete strain analysis with less computational cost. Experimental results demonstrated that the proposed method could simultaneously guarantee shape and deformation measurement accuracy. Meanwhile, both complete and fine surface geometry and its strain distributions can be obtained with simple convolution and algebraic operations, which can provide an alternative method for bridging 3-D geometric structures and the mechanical state of complex specimens.

Quality Assisted Three Fringe Photoelasticity for Autonomous Evaluation of Total Fringe Order

Simple Fringe Illumination Technique for Optical Superresolution

Fringe Non-Uniformity Correction Method Based on Gray Difference Estimation

New Quality Weight Used for Phase Unwrapping in Color Fringe Reflection Method

Threshold-optimized Dithering Technique for High-quality 3D Shape Measurement

Joint Chromatic Aberration Correction and Color Fringe Removal for Variable Aperture Optical System

Calculation of Aberration Fields for Freeform Imaging Systems Using Field-Dependent Footprints on Local Tangent Planes.

Fourier Transform Profilometry Using Zero Frequency Elimination Based on Gray Modulation

Research on Two Optical Methods for Aspheric Measurement

Quantification of Photoelastic Fringe Orders Using Polarized Light Camera and Continuous Loading

Fringe pattern analysis to evaluate light sources and sensors in digital photoelasticity

Synthesize-Then-Evaluate Based Optimal Exposures Selection for High Dynamic Range Fringe Projection Profilometry

Quality Guided Fringe Pattern Normalization

A Method for Suppressing Saturation-Induced Errors in Fringe Projection Profilometry by Fringe Restoration Assisted via Euler Formula-Based Method and Intersection Points

Oriented Boundary Padding for Iterative and Oriented Fringe Pattern Denoising Techniques.

Fast fringe projection profilometry using 3 + 1 phase retrieval strategy and fringe order correction

Precise Phase Measurement for Fringe Reflection Technique through Optimized Camera Response

Dynamic Three-Dimensional Shape Measurement for Specular Freeform Surfaces with the Quaternary Orthogonal Grid Fringes

Simulating Isochromatic Fringes from Finite Element Results of FEniCS

High-Efficiency Dynamic Three-Dimensional Topography Measurement Using the Phase Shift Generation Method

Chromatic DIC-Assisted Fringe Projection Profilometry for Shape, Deformation, and Strain Measurement With Intensity-Chroma Space Analysis