Hetero-dielectric macaroni channel cylindrical gate all around field effect transistor (HD-MC CGAA FET) for reduced gate leakage analog applications

Aapurva Kaul,Sonam Rewari,Deva Nand
DOI: https://doi.org/10.1007/s00542-023-05577-9
2023-12-25
Microsystem Technologies
Abstract:In this paper a Hetero-Dielectric Macaroni Channel Cylindrical Gate All Around FET (HD-MC CGAA FET) is proposed for reduced gate leakage analog application. The proffered device is also compared with a conventional Nanowire FET (NW-FET) and Dual Metal Hetero-Dielectric Cylindrical Gate All Around FET (DM-HD CGAA FET) so as to indicate the device efficiency of HD-MC CGAA FET. Both DM-HD CGAA FET and HD-MC CGAA FET have a combined vacuum dielectric at the drain with a silicon dioxide (SiO 2 ) gate dielectric at the source. The structure has a symmetric gate oxide that is excellent for low power applications because of its considerably lower BTBT and OFF state gate leakages. GIDL of the HD-MC CGAA FET is lower, suggesting that this device has better insulation against leakages and its I ON /I OFF ratio is higher making it better for digital applications. Based on the qualitatively obtained results, I ON /I OFF ratio of HD-MC CGAA FET is 856 times better than NW-FET and 309 times better than DM-HD CGAA FET. GIDL current of HD-MC CGAA FET is measured to be 10 –14 A as compared to 10 –12 A of DM-HD CGAA FET and 10 –10 A of NW-FET. It has also been entrenched that HD-MC CGAA FET has more promising I DS , g m , g d , GIDL, hole concentration, Transconduction Generation Factor and I ON /I OFF ratio than the existing NW-FET and DM-HD CGAA FET making it highly applicable for low leakage and high frequency digital and analog application.
engineering, electrical & electronic,materials science, multidisciplinary,nanoscience & nanotechnology,physics, applied
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