Advances in the use of Atomic Force Microscopy as a Diagnostic tool for Solar Cells Characterization: From Material Design to Device Applications

Chinedu Christian Ahia,Edson L. Meyer
DOI: https://doi.org/10.1002/pssa.202300293
2023-11-10
physica status solidi (a) - applications and materials science
Abstract:Considerable efforts in search for an effective characterization technique for photovoltaic devices with utmost precision has been on the increase. To accurately predict, understand and analyze the device performance or potential factors affecting performance, a reliable technique is vital. Different instruments and methods have been used for the characterization of solar cells depending on the specific properties of interest. Atomic force microscopy (AFM) is gradually becoming one of the leading surface analysis techniques of choice for probing surface patterns in a variety of materials with atomic precision using a cantilever. It has evolved as a reliable technique for the investigation of subatomic scale properties of materials such as photocurrent heterogeneity, electromechanical response, charge distribution, molecular weight effects and many other material parameters. The integration of artificial intelligence hybrid algorithms in AFM for optoelectronic device fabrication and characterization has increasingly emerged to be desirable due to its reliability and effectiveness in achieving high image resolution, automated analysis, actuation and the coupling of manufactured units with a precision down to atomic units. In this review, an investigation of topical developments in the use of AFM as a diagnostic tool for solar cells characterization is presented with special focus on polymer solar cells, perovskite solar cells, quantum dots sensitized solar cells, dye sensitized solar cells, fullerene based solar cells, III‐V based solar cells and silicon based solar cells. An overview of the applications and emerging opportunities arising from these advances are discussed. This article is protected by copyright. All rights reserved.
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