Combining computer vision and atomic force microscopy for 3D reconstruction

Charlotte Allard

DOI: https://doi.org/10.1038/s41578-024-00733-7

IF: 83.5

2024-09-21

Nature Reviews Materials

Abstract:An article in Communications Engineering presents a technique for the 3D reconstruction of nanoscale objects that uses atomic force microscopy and a computer vision algorithm.

materials science, multidisciplinary,nanoscience & nanotechnology

What problem does this paper attempt to address?

Image Scanning Fluorescence Emission Difference Microscopy Based On A Detector Array

Y. Li,S. Liu,D. Liu,S. Sun,C. Kuang,Z. Ding,X. Liu

DOI: https://doi.org/10.1111/jmi.12538

IF: 1.9522

2017-01-01

Journal of Microscopy

Abstract:We propose a novel imaging method that enables the enhancement of three-dimensional resolution of confocal microscopy significantly and achieve experimentally a new fluorescence emission difference method for the first time, based on the parallel detection with a detector array. Following the principles of photon reassignment in image scanning microscopy, images captured by the detector array were arranged. And by selecting appropriate reassign patterns, the imaging result with enhanced resolution can be achieved with the method of fluorescence emission difference. Two specific methods are proposed in this paper, showing that the difference between an image scanning microscopy image and a confocal image will achieve an improvement of transverse resolution by approximately 43% compared with that in confocal microscopy, and the axial resolution can also be enhanced by at least 22% experimentally and 35% theoretically. Moreover, the methods presented in this paper can improve the lateral resolution by around 10% than fluorescence emission difference and 15% than Airyscan. The mechanism of our methods is verified by numerical simulations and experimental results, and it has significant potential in biomedical applications.
Reconstruction from Multiple Poses in Fluorescence Imaging: Proof of Concept

Denis Fortun,Paul Guichard,Ning Chu,Michael Unser

DOI: https://doi.org/10.1109/jstsp.2015.2493884

IF: 7.695

2016-01-01

IEEE Journal of Selected Topics in Signal Processing

Abstract:One disadvantage of all fluorescence imaging modalities is a poor axial resolution. To overcome this issue, we propose a novel approach to reconstruct fluorescence volumes with isotropic high resolution, from images of particle replicates observed at multiple orientations. We design a joint deconvolution-and-multiview reconstruction approach dedicated to three-dimensional fluorescence imaging. We address the computational challenge associated to big data by designing a fast augmented-Lagrangian optimizer. The computational cost of the iterative part of the algorithm does not depend on the number of input particles. We experimentally demonstrate the resolution improvement yielded by our framework and its ability to handle practical constraints like large PSF sizes and large number of particles. The validation is performed on realistic simulated data, which establishes a proof of concept for our framework and defines it as the basis for future extensions.
Isotropic Resolution in Fluorescence Imaging by Single Particle Reconstruction

Denis Fortun,Paul Guichard,Ning Chu,Michael Unser

DOI: https://doi.org/10.1109/isbi.2016.7493256

2016-01-01

Abstract:Low axial resolution is a major limitation of fluorescence imaging modalities. We propose a methodology to achieve high isotropic resolution by reconstructing fluorescence volumes from observations of multiple particle replicates with different orientations. The challenge is to conciliate high reconstruction accuracy, requiring a large amount of input 3D data, with computational tractability. We achieve this goal by designing an iterative joint deconvolution and multiview reconstruction algorithm with an efficient augmented-Lagrangian based optimization. The computational cost is limited to only two FFTs per iterations, regardless of the number of input particles. We also adopt the nuclear norm of the Hessian as regularizer to avoid the usual staircase artifacts of the more standard total-variation. Experimental validation on realistic simulated data demonstrate the efficiency and accuracy of our method.
Multi-view neural 3D reconstruction of micro- and nanostructures with atomic force microscopy

Shuo Chen,Mao Peng,Yijin Li,Bing-Feng Ju,Hujun Bao,Yuan-Liu Chen,Guofeng Zhang

DOI: https://doi.org/10.1038/s44172-024-00270-9

2024-09-12

Abstract:Atomic Force Microscopy (AFM) is a widely employed tool for micro- and nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro- and nanostructures precisely due to limitations such as incomplete sample topography capturing and tip-sample convolution artifacts. Here, we propose a multi-view neural-network-based framework with AFM, named MVN-AFM, which accurately reconstructs surface models of intricate micro- and nanostructures. Unlike previous 3D-AFM approaches, MVN-AFM does not depend on any specially shaped probes or costly modifications to the AFM system. To achieve this, MVN-AFM employs an iterative method to align multi-view data and eliminate AFM artifacts simultaneously. Furthermore, we apply the neural implicit surface reconstruction technique in nanotechnology and achieve improved results. Additional extensive experiments show that MVN-AFM effectively eliminates artifacts present in raw AFM images and reconstructs various micro- and nanostructures, including complex geometrical microstructures printed via two-photon lithography and nanoparticles such as poly(methyl methacrylate) (PMMA) nanospheres and zeolitic imidazolate framework-67 (ZIF-67) nanocrystals. This work presents a cost-effective tool for micro- and nanoscale 3D analysis.
Multi-View Neural 3D Reconstruction of Micro-/Nanostructures with Atomic Force Microscopy

Shuo Chen,Mao Peng,Yijin Li,Bing-Feng Ju,Hujun Bao,Yuan-Liu Chen,Guofeng Zhang

2024-01-22

Abstract:Atomic Force Microscopy (AFM) is a widely employed tool for micro-/nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete sample topography capturing and tip-sample convolution artifacts. Here, we propose a multi-view neural-network-based framework with AFM (MVN-AFM), which accurately reconstructs surface models of intricate micro-/nanostructures. Unlike previous works, MVN-AFM does not depend on any specially shaped probes or costly modifications to the AFM system. To achieve this, MVN-AFM uniquely employs an iterative method to align multi-view data and eliminate AFM artifacts simultaneously. Furthermore, we pioneer the application of neural implicit surface reconstruction in nanotechnology and achieve markedly improved results. Extensive experiments show that MVN-AFM effectively eliminates artifacts present in raw AFM images and reconstructs various micro-/nanostructures including complex geometrical microstructures printed via Two-photon Lithography and nanoparticles such as PMMA nanospheres and ZIF-67 nanocrystals. This work presents a cost-effective tool for micro-/nanoscale 3D analysis.

Computer Vision and Pattern Recognition,Materials Science
Automatic 3D Reconstruction of SEM Images Based on Nano-robotic Manipulation and Epipolar Plane Images.

Weili Ding,Yanxin Zhang,Haojian Lu,Wenfeng Wan,Yajing Shen

DOI: https://doi.org/10.1016/j.ultramic.2019.02.014

IF: 2.994

2019-01-01

Ultramicroscopy

Abstract:This paper reports a new and general 3D reconstruction algorithm by using the light field reconstruction theory to effectively construct 3D SEM images in a large range. Firstly, a nano-robotic system was employed to automatically capture a group of SEM images along a linear path with a fixed step size, which allowed the 3D SEM images to be reconstructed beyond the field of view (FOV) of SEM. Then, the epipolar-plane images (EPI) were generated, and the depth image was reconstructed based on the specific linear structures emerging in EPI and the automatic depth estimation algorithm. After that, the depth image was stitched and the dense 3D point cloud was obtained by using the delaunay technology. Depth reconstruction with the proposed algorithm does not depend on the matching corresponding points technology. This means nearly all kinds of SEM samples, even those with a simple texture structure or an almost flat surface, can be reconstructed. In addition, the proposed method allows constructing the 3D images out of the FOV of SEM with the assistance of nanorobot. The performance of the proposed algorithm was tested using our self-built database with several microscopic samples. The results demonstrate that the proposed algorithm is general and effective and it is particularly suitable for reconstructing highly complex micro surfaces with a flat surface in a large range.
360° Multiparametric Imaging Atomic Force Microscopy: A Method for Three-Dimensional Nanomechanical Mapping.

Haojian Lu,Yongbing Wen,Hao Zhang,Hui Xie,Yajing Shen

DOI: https://doi.org/10.1016/j.ultramic.2018.09.013

IF: 2.994

2019-01-01

Ultramicroscopy

Abstract:Atomic Force Microscopy (AFM) has been intensively used for imaging, characterization and manipulation at the micro- and nanoscale. Taking into account that the material is usually anisotropic, it needs to be characterized in various regions and orientations. Although recent advances of AFM techniques have allowed for large area scan of the sample on a two-dimensional plane, mapping a three-dimensional (3D) sample at a full orientation of 360° remains challenge. This paper reports a multiparametric imaging atomic force microscope via robot technique for 360° mapping and 3D reconstruction of the sample's topography and nanomechanical properties. The system is developed by integrating a three degrees of freedom (DoFs) high-precision rotation stage and a home positioning approach is proposed to compensate for the eccentric distance between the cross-section center of the sample and the ration center of the stage. With this method, the sample surface can be fully mapped by the force-distance-based AFM via rotating the sample with a complete orientation. 360° multiparametric mapping and 3D reconstruction results (e.g., topography, adhesion, modulus, energy dissipation) of a human hair demonstrate practicability and reliability of the proposed method.
The 3D Reconstruction of Face Model with Active Structured Light and Stereo Vision Fusion

Jian Yang,Hui Chen

DOI: https://doi.org/10.1109/compcomm.2017.8322869

2017-01-01

Abstract:Active structured light and multi-view stereo vision methods reconstruct objects to gain 3D model. However, due to the large scale difference between the two types of point clouds, traditional registration method cannot find corresponding points. This paper presents a 3D reconstruction method fused active structured light and multi-view stereo vision. The precision of the 3D reconstruction is improved by combining point clouds obtained from different sensors. Firstly, a scaled-PCA-ICP(Principal Component Analysis-Iterative Closest Point) algorithm is proposed to do the registration that can overcome the influence of large scale variance. Secondly, because it is difficult for two sets of point clouds to choose their registration center, a recalculated registration center is proposed to realize the point clouds registration again. Finally, the two-view point clouds apply the accurate matching to achieve data fusion. Test on two databases show the effectiveness of this fusion reconstruction method.
A compact CCD-monitored atomic force microscope with optical vision and improved performances.

Liu Mingyue,Zhang Haijun,Zhang Dongxian

DOI: https://doi.org/10.1002/jemt.22250

2013-01-01

Microscopy Research and Technique

Abstract:A novel CCD-monitored atomic force microscope (AFM) with optical vision and improved performances has been developed. Compact optical paths are specifically devised for both tip-sample microscopic monitoring and cantilever's deflection detecting with minimized volume and optimal light-amplifying ratio. The ingeniously designed AFM probe with such optical paths enables quick and safe tip-sample approaching, convenient and effective tip-sample positioning, and high quality image scanning. An image stitching method is also developed to build a wider-range AFM image under monitoring. Experiments show that this AFM system can offer real-time optical vision for tip-sample monitoring with wide visual field and/or high lateral optical resolution by simply switching the objective; meanwhile, it has the elegant performances of nanometer resolution, high stability, and high scan speed. Furthermore, it is capable of conducting wider-range image measurement while keeping nanometer resolution. Microsc. Res. Tech. 76:931-935, 2013. (c) 2013 Wiley Periodicals, Inc.
Atomic force microscopy 3D structural reconstruction of individual particles in the study of amyloid protein assemblies

Claudia Chitty,Kinga Kuliga,Wei-Feng Xue

DOI: https://doi.org/10.1042/bst20230857

2024-04-11

Biochemical Society Transactions

Abstract:Recent developments in atomic force microscopy (AFM) image analysis have made three-dimensional (3D) structural reconstruction of individual particles observed on 2D AFM height images a reality. Here, we review the emerging contact point reconstruction AFM (CPR-AFM) methodology and its application in 3D reconstruction of individual helical amyloid filaments in the context of the challenges presented by the structural analysis of highly polymorphous and heterogeneous amyloid protein structures....

biochemistry & molecular biology
Simulation atomic force microscopy for atomic reconstruction of biomolecular structures from resolution-limited experimental images

Romain Amyot,Arin Marchesi,Clemens M. Franz,Ignacio Casuso,Holger Flechsig

DOI: https://doi.org/10.1371/journal.pcbi.1009970

2022-03-16

PLoS Computational Biology

Abstract:Atomic force microscopy (AFM) can visualize the dynamics of single biomolecules under near-physiological conditions. However, the scanning tip probes only the molecular surface with limited resolution, missing details required to fully deduce functional mechanisms from imaging alone. To overcome such drawbacks, we developed a computational framework to reconstruct 3D atomistic structures from AFM surface scans, employing simulation AFM and automatized fitting to experimental images. We provide applications to AFM images ranging from single molecular machines, protein filaments, to large-scale assemblies of 2D protein lattices, and demonstrate how the obtained full atomistic information advances the molecular understanding beyond the original topographic AFM image. We show that simulation AFM further allows for quantitative molecular feature assignment within measured AFM topographies. Implementation of the developed methods into the versatile interactive interface of the BioAFMviewer software, freely available at www.bioafmviewer.com , presents the opportunity for the broad Bio-AFM community to employ the enormous amount of existing structural and modeling data to facilitate the interpretation of resolution-limited AFM images.

biochemical research methods,mathematical & computational biology
Combining Photogrammetry and Photometric Stereo to Achieve Precise and Complete 3D Reconstruction

Ali Karami,Fabio Menna,Fabio Remondino

DOI: https://doi.org/10.3390/s22218172

IF: 3.9

2022-10-26

Sensors

Abstract:Image-based 3D reconstruction has been employed in industrial metrology for micro-measurements and quality control purposes. However, generating a highly-detailed and reliable 3D reconstruction of non-collaborative surfaces is still an open issue. In this paper, a method for generating an accurate 3D reconstruction of non-collaborative surfaces through a combination of photogrammetry and photometric stereo is presented. On one side, the geometric information derived with photogrammetry is used in areas where its 3D measurements are reliable. On the other hand, the high spatial resolution capability of photometric stereo is exploited to acquire a finely detailed topography of the surface. Finally, three different approaches are proposed to fuse both geometric information and high frequency details. The proposed method is tested on six different non-collaborative objects with different surface characteristics. To evaluate the accuracy of the proposed method, a comprehensive cloud-to-cloud comparison between reference data and 3D points derived from the proposed fusion methods is provided. The experiments demonstrated that, despite correcting global deformation up to an average RMSE of less than 0.1 mm, the proposed method recovers the surface topography at the same high resolution as the photometric stereo.

engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation
Three-dimensional visualization of large-area, nanoscale topography measurements

Eva Natinsky,Liam G. Connolly,Michael Cullinan

DOI: https://doi.org/10.1088/1361-6528/ad8165

IF: 3.5

2024-10-01

Nanotechnology

Abstract:High-resolution metrology is a critical area of development for nanoscale manufacturing, especially as it affects production throughput and fabrication quality. Atomic force microscopy (AFM) is one of the most popular tools for nanometrology, and high-resolution AFM often requires a significant time commitment and produces datasets of several million points. It is therefore critical for the development of data processing techniques to keep pace with the requirements of analyzing this type of data, and for these techniques to be portable as miniaturization in AFM is becoming more common. This work presents a data fitting algorithm designed for reducing the parameters of large-area data sets which utilizes well-established spline fitting techniques. In this paper we show that basis-spline fitting can be used to accurately represent large AFM data sets, including data sets with noisy data and sharp features, while achieving at least 90% parameter reduction in all test cases.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology
3D reconstruction of a million atoms by multiple-section local-orbital tomography

Liangze Mao,Jizhe Cui,Rong Yu

2024-05-25

Abstract:There exist two groups of electron microscopy methods that are capable of providing three-dimensional (3D) structural information of an object, i.e., electron tomography and depth sectioning. Electron tomography is capable of resolving atoms in all three dimensions, but the accuracy in atomic positions is low and the object size that can be reconstructed is limited. Depth sectioning methods give high positional accuracy in the imaging plane, but the spatial resolution in the third dimension is low. In this work, electron tomography and depth sectioning are combined to form a method called multiple-section local-orbital tomography, or nLOT in short. The nLOT method provides high spatial resolution and high positional accuracy in all three dimensions. The object size that can be reconstructed is extended to a million atoms. The present method establishes a foundation for the widespread application of atomic electron tomography.

Materials Science
Quantitative 3D Reconstruction from Scanning Electron Microscope Images Based on Affine Camera Models

Stefan Töberg,Eduard Reithmeier

DOI: https://doi.org/10.3390/s20123598

2020-06-26

Abstract:Scanning electron microscopes (SEMs) are versatile imaging devices for the micro- and nanoscale that find application in various disciplines such as the characterization of biological, mineral or mechanical specimen. Even though the specimen's two-dimensional (2D) properties are provided by the acquired images, detailed morphological characterizations require knowledge about the three-dimensional (3D) surface structure. To overcome this limitation, a reconstruction routine is presented that allows the quantitative depth reconstruction from SEM image sequences. Based on the SEM's imaging properties that can be well described by an affine camera, the proposed algorithms rely on the use of affine epipolar geometry, self-calibration via factorization and triangulation from dense correspondences. To yield the highest robustness and accuracy, different sub-models of the affine camera are applied to the SEM images and the obtained results are directly compared to confocal laser scanning microscope (CLSM) measurements to identify the ideal parametrization and underlying algorithms. To solve the rectification problem for stereo-pair images of an affine camera so that dense matching algorithms can be applied, existing approaches are adapted and extended to further enhance the yielded results. The evaluations of this study allow to specify the applicability of the affine camera models to SEM images and what accuracies can be expected for reconstruction routines based on self-calibration and dense matching algorithms.
Fast and robust single particle reconstruction in 3D fluorescence microscopy

Thibaut Eloy,Etienne Baudrier,Marine Laporte,Virginie Hamel,Paul Guichard,Denis Fortun

DOI: https://doi.org/10.48550/arXiv.2301.09452

2023-01-23

Abstract:Single particle reconstruction has recently emerged in 3D fluorescence microscopy as a powerful technique to improve the axial resolution and the degree of fluorescent labeling. It is based on the reconstruction of an average volume of a biological particle from the acquisition multiple views with unknown poses. Current methods are limited either by template bias, restriction to 2D data, high computational cost or a lack of robustness to low fluorescent labeling. In this work, we propose a single particle reconstruction method dedicated to convolutional models in 3D fluorescence microscopy that overcome these issues. We address the joint reconstruction and estimation of the poses of the particles, which translates into a challenging non-convex optimization problem. Our approach is based on a multilevel reformulation of this problem, and the development of efficient optimization techniques at each level. We demonstrate on synthetic data that our method outperforms the standard approaches in terms of resolution and reconstruction error, while achieving a low computational cost. We also perform successful reconstruction on real datasets of centrioles to show the potential of our method in concrete applications.

Image and Video Processing,Computer Vision and Pattern Recognition
Towards 3D Vision with Low-Cost Single-Photon Cameras

Fangzhou Mu,Carter Sifferman,Sacha Jungerman,Yiquan Li,Mark Han,Michael Gleicher,Mohit Gupta,Yin Li

2024-03-30

Abstract:We present a method for reconstructing 3D shape of arbitrary Lambertian objects based on measurements by miniature, energy-efficient, low-cost single-photon cameras. These cameras, operating as time resolved image sensors, illuminate the scene with a very fast pulse of diffuse light and record the shape of that pulse as it returns back from the scene at a high temporal resolution. We propose to model this image formation process, account for its non-idealities, and adapt neural rendering to reconstruct 3D geometry from a set of spatially distributed sensors with known poses. We show that our approach can successfully recover complex 3D shapes from simulated data. We further demonstrate 3D object reconstruction from real-world captures, utilizing measurements from a commodity proximity sensor. Our work draws a connection between image-based modeling and active range scanning and is a step towards 3D vision with single-photon cameras.

Computer Vision and Pattern Recognition,Image and Video Processing
Correlative AFM and Scanning Microlens Microscopy for Time-Efficient Multiscale Imaging

Tianyao Zhang,Haibo Yu,Jialin Shi,Xiaoduo Wang,Hao Luo,Daojing Lin,Zhu Liu,Chanmin Su,Yuechao Wang,Lianqing Liu

DOI: https://doi.org/10.1002/advs.202103902

Abstract:With the rapid evolution of microelectronics and nanofabrication technologies, the feature sizes of large-scale integrated circuits continue to move toward the nanoscale. There is a strong need to improve the quality and efficiency of integrated circuit inspection, but it remains a great challenge to provide both rapid imaging and circuit node-level high-resolution images simultaneously using a conventional microscope. This paper proposes a nondestructive, high-throughput, multiscale correlation imaging method that combines atomic force microscopy (AFM) with microlens-based scanning optical microscopy. In this method, a microlens is coupled to the end of the AFM cantilever and the sample-facing side of the microlens contains a focused ion beam deposited tip which serves as the AFM scanning probe. The introduction of a microlens improves the imaging resolution of the AFM optical system, providing a 3-4× increase in optical imaging magnification while the scanning imaging throughput is improved ≈8×. The proposed method bridges the resolution gap between traditional optical imaging and AFM, achieves cross-scale rapid imaging with micrometer to nanometer resolution, and improves the efficiency of AFM-based large-scale imaging and detection. Simultaneously, nanoscale-level correlation between the acquired optical image and structure information is enabled by the method, providing a powerful tool for semiconductor device inspection.
3D nanostructure reconstruction based on the SEM imaging principle, and applications.

Fu-Yun Zhu,Qi-Qi Wang,Xiao-Sheng Zhang,Wei Hu,Xin Zhao,Hai-Xia Zhang

DOI: https://doi.org/10.1088/0957-4484/25/18/185705

IF: 3.5

2014-01-01

Nanotechnology

Abstract:This paper addresses a novel 3D reconstruction method for nanostructures based on the scanning electron microscopy (SEM) imaging principle. In this method, the shape from shading (SFS) technique is employed, to analyze the gray-scale information of a single top-view SEM image which contains all the visible surface information, and finally to reconstruct the 3D surface morphology. It offers not only unobstructed observation from various angles but also the exact physical dimensions of nanostructures. A convenient and commercially available tool (NanoViewer) is developed based on this method for nanostructure analysis and characterization of properties. The reconstruction result coincides well with the SEM nanostructure image and is verified in different ways. With the extracted structure information, subsequent research of the nanostructure can be carried out, such as roughness analysis, optimizing properties by structure improvement and performance simulation with a reconstruction model. Efficient, practical and non-destructive, the method will become a powerful tool for nanostructure surface observation and characterization.
Reconstruction of nanoscale particles from single-shot wide-angle FEL diffractions patterns with physics-informed neural networks

Thomas Stielow,Stefan Scheel

DOI: https://doi.org/10.1103/PhysRevE.103.053312

2021-05-10

Abstract:Single-shot wide-angle diffraction imaging is a widely used method to investigate the structure of non-crystallizing objects such as nanoclusters, large proteins or even viruses. Its main advantage is that information about the three-dimensional structure of the object is already contained in a single image. This makes it useful for the reconstruction of fragile and non-reproducible particles without the need for tomographic measurements. However, currently there is no efficient numerical inversion algorithm available that is capable of determining the object's structure in real time. Neural networks, on the other hand, excel in image processing tasks suited for such purpose. Here we show how a physics-informed deep neural network can be used to reconstruct complete three-dimensional object models of uniform, convex particles on a voxel grid from single two-dimensional wide-angle scattering patterns. We demonstrate its universal reconstruction capabilities for silver nanoclusters, where the network uncovers novel geometric structures that reproduce the experimental scattering data with very high precision.

Data Analysis, Statistics and Probability,Disordered Systems and Neural Networks

Combining computer vision and atomic force microscopy for 3D reconstruction

Image Scanning Fluorescence Emission Difference Microscopy Based On A Detector Array

Reconstruction from Multiple Poses in Fluorescence Imaging: Proof of Concept

Isotropic Resolution in Fluorescence Imaging by Single Particle Reconstruction

Multi-view neural 3D reconstruction of micro- and nanostructures with atomic force microscopy

Multi-View Neural 3D Reconstruction of Micro-/Nanostructures with Atomic Force Microscopy

Automatic 3D Reconstruction of SEM Images Based on Nano-robotic Manipulation and Epipolar Plane Images.

360° Multiparametric Imaging Atomic Force Microscopy: A Method for Three-Dimensional Nanomechanical Mapping.

The 3D Reconstruction of Face Model with Active Structured Light and Stereo Vision Fusion

A compact CCD-monitored atomic force microscope with optical vision and improved performances.

Atomic force microscopy 3D structural reconstruction of individual particles in the study of amyloid protein assemblies

Simulation atomic force microscopy for atomic reconstruction of biomolecular structures from resolution-limited experimental images

Combining Photogrammetry and Photometric Stereo to Achieve Precise and Complete 3D Reconstruction

Three-dimensional visualization of large-area, nanoscale topography measurements

3D reconstruction of a million atoms by multiple-section local-orbital tomography

Quantitative 3D Reconstruction from Scanning Electron Microscope Images Based on Affine Camera Models

Fast and robust single particle reconstruction in 3D fluorescence microscopy

Towards 3D Vision with Low-Cost Single-Photon Cameras

Correlative AFM and Scanning Microlens Microscopy for Time-Efficient Multiscale Imaging

3D nanostructure reconstruction based on the SEM imaging principle, and applications.

Reconstruction of nanoscale particles from single-shot wide-angle FEL diffractions patterns with physics-informed neural networks