Run-to-run Trajectory Prediction of Uneven-length Batch Processes Using DTW-LSTM

Zhiqiang Ge,Zhihuan Song,Saite Fan,Feifan Shen,Lingjian Ye
DOI: https://doi.org/10.1109/DDCLS.2019.8908850
2019-05-01
Abstract:This paper handles with the problem of the run-to-run trajectory prediction of batch processes with uneven batch length. Most current data-driven works focus on the run-to-run variations during both batch trajectory modeling and prediction stages. However, batch-to-batch correlations should be drawn extreme attentions to when gradual changes exist in batch sequence. To obtain a better batch trajectory prediction performance of uneven-length batch processes, dynamic time warping (DTW) and long-short term memory (LSTM) neural network are introduced in this work to extract batch-to-batch correlations. Firstly, the recursive DTW is used to synchronize uneven batch samples. Then, the LSTM neural network is introduced to extract the run-to-run batch correlations during the trajectory modeling stage. Finally, online batch trajectory prediction can be implemented according to the offline LSTM model. A simulation based on the fed-batch penicillin fermentation process is provided to testify the effectiveness of the proposed method.
Computer Science,Engineering
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