New speckle pattern interferometry for precise in situ deformation measurements

Ruyue Zhang,Yu Fu,Hong Miao

DOI: https://doi.org/10.3788/col202422.011202

IF: 2.56

2024-01-10

Chinese Optics Letters

Abstract:Ruyue Zhang, Yu Fu, Hong Miao A new electronic speckle pattern interferometry method is proposed to realize in situ deformation measurements. The feature of the method ... [Chin. Opt. Lett. 22, 011202- (2024)]

optics

What problem does this paper attempt to address?

Speckle technique applied to precise measurement of strain

zhixin chen,jin liang,dehai zhang,cheng guo,zhengzong tang

DOI: https://doi.org/10.1109/ICCET.2010.5485597

2010-01-01

Abstract:The strain measurement is very important in engineering, there are many traditional methods, and have a lot of new methods. In this paper, introduced how to use the speckle method for accurate measurement of strain, and compared with traditional methods. It not only described its basic principle, but also developed the corresponding software. And carry out specific tensile experiment, showing the method have the advantages of non - contact, high precision, simple and flexible operation, overall measuring and so on.
Simultaneous 3D measurement of deformation and its first derivative with speckle pattern interferometry and shearography

Qihan Zhao,Weijie Chen,Fangyuan Sun,PeiZheng Yan,Bing Ye,Yonghong Wang

DOI: https://doi.org/10.1364/AO.58.008665

2019-11-01

Abstract:Digital speckle pattern interferometry and digital shearography are widely used in nondestructive testing due to their advantages of high speed, full field, and high sensitivity. However, traditional speckle pattern interferometry and shearography can only measure a single variable of deformation or strain. This study presents a modified common measurement setup that can simultaneously measure deformation and its first derivative. In the optical setup, a reference beam is introduced behind the shearing device to interfere with the object beams, thereby simplifying the spectrum and improving the quality of the phase maps. Then the spatial carrier technology is used to extract phase and achieve dynamic measurements. The proposed system also expands the measurement range using a ${4}f$4f system. This study also presents a 3D optical setup based on the 1D system, which is more suitable for practical measurement applications in industrial areas. Theoretical derivation and experimental results are described and presented.
On-Site Dynamic Deformation Measurements Based on Enhanced Temporal Speckle Pattern Interferometry

Ruyue Zhang,Lizhao Lai,Jingchao Xu,Jicen Hu,Yu Fu,Hong Miao

DOI: https://doi.org/10.1016/j.optlaseng.2024.108411

IF: 5.666

2024-01-01

Optics and Lasers in Engineering

Abstract:This paper proposes a dynamic deformation measurement method based on temporal speckle pattern interferometry, tailored for on-site applications. This technique utilizes an improved dynamic phase extraction algorithm to obtain phases associated with both ground vibrations and object deformations. Deformations are discerned from vibrations by employing a synchronized measurement system that integrates laser Doppler vibrometers and a high-speed camera. The effectiveness of the method for dynamic deformation measurements under micron-level vibrations is verified by experiments.
The Research of Speckle Technique in Deformation Measurement Fields

Zhixin Chen,Jin Liang,Cheng Guo

DOI: https://doi.org/10.4028/www.scientific.net/amr.201-203.1998

2011-01-01

Advanced Materials Research

Abstract:The traditional deformation measurement have many limitations, According to actual measurement need, it is requested not only comprehensive, flexible, high-precision, but also can describe the various points displacement within the measurement scope at any time, get the most comprehensive data. In this paper, used speckle methods to carry on deformation accurate and comprehensive measuring. First, compared with traditional methods, showed its many advantages, including: non-contact, high precision, operation simple and flexibility, etc. Then specified the main basic theory of the speckle method, established relevant mathematical models, developed the appropriate measurement and analysis software XJTUDIC, and used the software with the appropriate hardware equipment to test a specific tensile deformation process, and compared the results with using traditional extensometer measurement methods, through calculation got the error is within ± 0.2%. This fully validated the method and corresponding software and hardware were reliable, feasible and excellent.
Simultaneous measurement of three-dimensional deformation based on digital speckle pattern interferometry technology

Zhisong Li,Ping Zhong,Yu Chen,Xin Tang,Yinrui Gao,Haowei Hu

DOI: https://doi.org/10.1016/j.optcom.2020.126423

IF: 2.4

2021-02-01

Optics Communications

Abstract:<p>In the present study, a brief, efficient and synchronous 3D (three-dimensional) deformation measurement method based on digital speckle pattern interferometry (DSPI) and digital shear speckle interference (DSSPI) was proposed. Comparing with traditional multi-laser and multi-CCD DSPI methods, this method used a single CCD and two lasers to capture the speckle patterns from three sensitive directions simultaneously, which simplified the optical arrangement, reduced the system cost, and improved the detection efficiency effectively. Based on the proposed method, the phase maps could be obtained by space carrier method, and the phase maps included both out-of-plane deformation and in-plane strain information (vertical in-plane, horizontal in-plane and out-of-plane). According to the deformation and strain information, the 3D deformation distribution could be obtained through an integral operation. In the present study, the measuring algorithm and optical arrangement were described in detail, and experiments were carried out to verify the validity.</p>

optics
Fabrication of Micro-Scale Speckle Pattern and Its Applications for Deformation Measurement

Huaixi Wang,Huimin Xie,Yanjie Li,Jianguo Zhu

DOI: https://doi.org/10.1088/0957-0233/23/3/035402

IF: 2.398

2012-01-01

Measurement Science and Technology

Abstract:A novel and effective method of fabricating a micro-scale speckle pattern applied to metallic and polymeric materials is described. It can be used for measuring deformation under an optical microscope or other high magnification imaging systems. In this paper, the mean intensity gradient (MIG) is used to evaluate the quality of speckle pattern under different fabrication conditions, such as proportion of compound, spinning rates and centrifugal solidifying time, and the optimal fabrication parameters are proposed. Finally, deformation of a PET thin film and interface of an optical fiber device are measured with fabricated micro-scale speckle pattern. Further, it is proved that the speckle pattern produced by the novel method can be used with digital image correlation to measure deformation at micro-length scale.
Surface Patterning for Multi-Scale Strain Analysis of In-Situ Sem Mechanical Experiments

Bin Zhang,Xianjue Ye,Jin Wang,Yuefei Zhang,Ze Zhang

DOI: https://doi.org/10.1016/j.jmrt.2024.11.188

IF: 6.267

2024-01-01

Journal of Materials Research and Technology

Abstract:Scanning electron microscopy (SEM) enables microstructure characterization at multi-scale, having potential to quantify strain distribution across multiple fields of view (FOVs) and exploring coordinated relationships among the deformations of multi-scale microstructures. Optimizing distribution of multi-scale speckles is crucial for achieving high precision and efficiency in digital image correlation (DIC) computations. In this work, a multi-scale strain measurement method is proposed for in-situ SEM mechanical experiments, which relies on an uncomplicated multi-scale speckle preparation method. Multi-scale speckle preparation can be achieved by the combination of spin-coating and magnetron sputtering. By using micro- and macro-speckle, multi-scale strain calculations can be achieved during the in-situ SEM mechanical loading. The InSn macro-speckle is composed of controllable-sized InSn nanoscale speckles, ensuring that the accuracy of DIC measurements in the microscopic regions are not compromised by the coverage of macro-speckles in the testing region. In regions covered exclusively by SiO2 nano-speckles, in-situ SEM mechanical loading allows for the acquisition of high-resolution DIC (HR-DIC) and electron backscatter diffraction (EBSD) data from the same region and under the same deformation state. Experiments are conducted to illustrate the functionality and utility of the multi-scale speckles. Such experimental analyses offer an opportunity to further explore multi-scale strain heterogeneity in some advanced structural materials and provide reliable experimental verification for material mechanics simulations.
Application of the Speckle Technique for Three-Dimensional Deformation Measurement

Zhi-Xin Chen,Jin Liang,Cheng Guo,Hao Hu

DOI: https://doi.org/10.1117/1.oe.51.1.013604

IF: 1.3

2012-01-01

Optical Engineering

Abstract:Abstract. In order to obtain more comprehensive three-dimensional (3-D) deformation data, improve the flexibility and precision of 3-D deformation measurement, and describe the real-time displacement of various points in the measurement scope, we researched speckle methods in this field. First, we expounded basic theories of speckle technique and elaborated on several important aspects of 3-D measurement, including camera calibration, images matching, and 3-D coordinate and displacement calculation. Then, we established the relevant mathematical models and developed a corresponding measurement and analysis software, XJTUDIC. Aided with the appropriate hardware devices, this software recorded and analyzed the whole process of tensile deformation. When compared with the results of the simulation analysis using ANSYS, this method achieved a relative error within ±0.75%, demonstrating the reliability, feasibility, and advantage of this method and its corresponding applied software and hardware.
Deformation Measurement of A Small Component and A Thin Film Using Time Sequence Speckle Pattern Interferometry

XD Li,B Deng,G Tao

DOI: https://doi.org/10.1515/ijnsns.2002.3.3-4.653

2002-01-01

International Journal of Nonlinear Sciences and Numerical Simulation

Abstract:The rapid development of microelectromechanical system (MEMS), thin film technology and material research in mechanical behaviors gives new impetus to high-precision and quantitative deformation measurement in sub-micrometer level. Optical method is a versatile, noncontact, full field and height sensitivity technique and has been popularly applied to deformation measurement in numerous fields. However, the well-known optical arrangements have been for a long time focusing on large and medium size samples and view field. The load manner, measurement sensitivity and instruments cannot satisfy well for deformation measurement in micro-region of a component or a low-dimensional structure. In this paper we describe the applications of time sequence speckle pattern interferometry (TSSPI) to measure the deformation of a small cantilever and purity Ni thin film in submicrometer level subjected to bending loading. The compact measurement systems including a digital speckle interferometry and a micro loading system have been built and a phase demodulation method has also been proposed.
Dynamic deformation measurement with 2-frame phase-shifting speckle interferometry based on speckle statistics and wavefront multiplexing

Yijun Du,Junxiang Li,Chen Fan,Zixin Zhao,Hong Zhao

DOI: https://doi.org/10.1063/5.0226584

2024-09-01

Abstract:Phase-shifting speckle interferometry could achieve full-field deformation measurement of rough surfaces. To meet the dynamic requirement and further improve the accuracy, a two-step synchronous phase-shifting measurement system is established based on the polarization-sensitive phase modulation ability of a liquid crystal spatial light modulator; by multiplexing the reference wavefront, an accurate phase shift is generated between two independent recording channels, and a common-path self-reference vortex interference structure is built for precise spatial registration. Meanwhile, according to the speckle statistical principle, a novel two-frame phase-shifting algorithm as well as a two-step spatial registration strategy is presented to strengthen the robustness of intensity and position differences caused by spatial-multiplexing; thereby, accurate transient deformation can be directly obtained from phase-shifting speckle interferograms recorded before and after deformation. The effectiveness and accuracy of the proposal are validated from the out-of-plane deformation measurement experiment by comparing with the traditional two-step and four-step phase-shifting methods. The dynamic ability is exhibited through reconstructing mechanical and thermal deformations across various application scenarios.
Real-Time One-Point Out-Of-Plane Displacement Measurement System Using Electronic Speckle Pattern Interferometry

Chen Xiong,Wenxin Hu,Ming Zhang,Hong Miao

DOI: https://doi.org/10.1117/1.oe.55.12.121721

IF: 1.3

2016-01-01

Optical Engineering

Abstract:We propose an electronic speckle pattern interferometry-based measurement method in which a hardware device in the reference arm is used to track the out-of-plane displacement in the objective arm. We developed a real-time one-point out-of-plane displacement measurement system, which uses a Michelson interferometer, a lead zirconate titanate (PZT) device, a charge-coupled device camera, and a tracking control system. The system works by checking the movement of carrier fringes, and the PZT is used to track the displacement. We also developed an efficient tracking algorithm based on direction judgment and correlation computation to determine whether the PZT is activated and the distance that the PZT is ordered to move. Our experimental results demonstrate the effectiveness of the system, and finally, we discuss the detailed mechanism of the system. (C) 2016 Society of Photo-Optical Instrumentation Engineers
Measurement of out-of-plane deformation by combination of speckle photography and speckle shearing interferometry

B. Barrientos,R.A. Martínez-Celorio,Luis Martí López,J.J.J. Dirckx,Moisés Cywiak

DOI: https://doi.org/10.1078/0030-4026-00362

IF: 3.1

2004-01-01

Optik

Abstract:We measure the derivative of out-of-plane deformation in presence of large in-plane rigid body displacement (RBD) by a combination of Electronic Speckle-Shearing Pattern Interferometry (ESSPI) and speckle photography. We use digital speckle photography in order to compensate for the in-plane RBD and eliminate any decorrelation effects. ESSPI techniques are then applied to the compensated speckle images to obtain the derivative of the out-of-plane deformation. The method is tested on an aluminum plate subjected to simultaneous out-of-plane deformation and large in-plane RBD. The results indicate that the proposed method preserves the fringe contrast observed in ESSPI.

optics
High-Precision Large Deflection Measurements of Thin Films Using Time Sequence Speckle Pattern Interferometry

XD Li,AK Soh,B Deng,XH Guo

DOI: https://doi.org/10.1088/0957-0233/13/8/319

2002-01-01

Abstract:The rapid development of microelectromechanical systems, thin-film technology and material research in mechanical behaviours, has provided new impetus to handle high-precision and large-amplitude deformation measurements. Optical methods are very useful in making non-contact and full field measurements of the deformation of an object. However, there is a gap between the sensitivity and the measurement range in the existing coherent and incoherent optical methods. In this paper, we propose some approaches to employ time sequence speckle pattern interferometry to measure large deformations of pure Ni thin films subjected to bending with high sensitivity. We introduce a new large deformation measurement system, which includes a digital speckle interferometry and a micro loading system, and we propose two methods of phase demodulation in this paper. The new system is capable of automatically applying micro loading and continuously capturing the temporal speckle patterns imaged from the flexural surfaces of the thin film. Forty thousand frames of the time sequence speckle patterns have been recorded and the maximum deflection of about 1400 mum has been measured with sensitivities of lambda/2 and lambda/4 by the different proposed methods, respectively.
High Speed Deformation Measurement Using Digital Speckle Correlation Method

Hua Chen,Dong Ye,Rensheng Che

DOI: https://doi.org/10.1117/12.725219

2007-01-01

Abstract:This article discusses an advanced deformation method based on digital speckle correlation method, which is substantially more robust and has greater dynamic range than other full-field imaging technologies such as ESPI and moire. The system tracks the stochastic pattern applied to the measurement surface with sub-pixel accuracy. The object under test is viewed by a pair of high resolution, digital CCD cameras. Two cameras having been mounted the locations and attitudes were calibrated prior to measurement by combining nonlinear optimization with accurate calibration points. The calibration points were formed by an infrared LED, which moved with 3-D coordinate measurement machine. By using bilinear interpolation square-gray weighted centroid location algorithm, the imaging centers of the calibration points can be accurate. The speckle images of the same measured zone from different directions for the specimen are recorded by two cameras before and after deformation. Then the deformation displacement and strain of the specimen is calculated by these images using digital speckle correlation method and geometrical relation of stereography. The performance was demonstrated with real translation test.
Deformation analysis with temporal speckle pattern interferometry

Xide Li

DOI: https://doi.org/10.1117/1.1336527

IF: 1.3

2001-01-01

Optical Engineering

Abstract:The continual deformation of an object will lead to a temporal speckle pattern. By analyzing this time-dependent speckle pattern the temporal deformations of the object can be obtained. We propose a method for measuring the displacement components caused by defor- mations using the temporal speckle pattern interferometry (TSPI). By capturing a series of speckle interference patterns related to the object deformations, we can get the fluctuations in the intensity of the interfer- ence patterns. Further, the phase maps for whole-field object displace- ments are calculated with the inversion of the temporal interference in- tensities by estimating both the average intensity and the modulation. In this way, one can quantitatively measure temporal displacements simply using a conventional electronic speckle pattern interferometry (ESPI) system without phase shifting or a carrier. An elaboration of the TSPI is presented and out-of-plane displacements caused by pressure and ther- mal deformations are measured. © 2001 Society of Photo-Optical Instrumentation Engineers. (DOI: 10.1117/1.1336527)
Accurate Dynamic 3D Deformation Measurement Based on the Synchronous Multiplexing of Polarization and Speckle Metrology

Yijun Du,Junxiang Li,Hong Zhao,Zixin Zhao,Chen Fan,Menghang Zhou,Xingyu Yang,Rong Zhao

DOI: https://doi.org/10.1364/ol.485969

IF: 3.6

2023-01-01

Optics Letters

Abstract:An accurate dynamic 3D deformation measurement method realized by the combination of phase-shifting speckle interferometry and speckle correlation is proposed. By converting the speckle field and the reference field into a circular polarized and linear polarized state, the three-step phase-shifting speckle interferograms and one specklegram were recorded directly and simultaneously within a single image by using a polarization camera. Then, the out-of-plane deformation was demodulated from the synchronous phase-shifting fringe patterns, and the in-plane deformation was measured by performing correlation calculations by using specklegrams with the effect of the reference field ignored. Thus, the full-field 3D deformation was obtained precisely. Experimental results demonstrated the accuracy and dynamic measurement ability of the proposed method, which is compact and feasible for actual dynamic scenes.
Direct strain measurement method based on the correlation of defocused laser speckle pattern

Wenxin Hu,Chen Xiong,Yu Fu,Xiping Hu

DOI: https://doi.org/10.1016/j.optlaseng.2024.108051

IF: 5.666

2024-02-02

Optics and Lasers in Engineering

Abstract:The structural strain field corresponds to the stress of each point and is an important unavoidable parameter in structural analysis or structural testing. The noncontact optical strain measurement methods are mainly divided into indirect strain measurement methods derived from displacement field differentiation and direct strain measurement methods represented by the digital shearing speckle pattern interferometry. The full-field displacement in the indirect measurement technique is commonly obtained using the electronic speckle pattern interferometry method, the digital image correlation method based on binocular camera or scanning laser doppler vibrometer method, and the differential operation further amplifies the measurement error. This study proposed a strain measurement method based on the defocused laser speckle pattern. In the case of defocus, the laser speckle field is sensitive to only the tilt angle, and the motion mode is the lateral translation of the same speckle field. The strain information can be obtained directly by the correlation calculation of laser speckle patterns before and after deformation. Experiments of the cantilever beam and bilateral clamped plate verified the effectiveness of the proposed method and proved that the proposed method made up for the limitations of the digital image correlation method and digital shearing speckle pattern interferometry method to a certain extent. Appropriate optical parameters and imaging parameters should be selected to ensure the quality of the laser speckle pattern and measurement accuracy.

optics
Digital Speckle Pattern Interferometry for Observing the Entire Process of Plastic Deformation of a Solid Object

Satoru Toyooka,Xinglong Gong

DOI: https://doi.org/10.1143/JJAP.34.L1666

1995-01-01

Abstract:A new scheme of digital speckle pattern interferometer (DSPI) for observing the entire process of dynamic deformation from the beginning of elastic deformation to the end of plastic deformation at fracture is proposed. Interesting deformation processes which consist of spatial mode division of fringes caused by plastic deformation and stress relaxation were clarified by simple experiments.
Measuring micro-displacements of specular surfaces using speckle interferometry

Andrés E. Dolinko,Gustavo E. Galizzi

DOI: https://doi.org/10.48550/arXiv.1903.10300

2018-12-25

Abstract:The displacement field of an object surface can be measured by using speckle interferometry. This technique is based on the phenomenon of laser speckle and consists in correlating speckle interferograms taken after and before the deformation of the surface. The main requirement is that the surface under study must be optically rough to generate the speckle patterns to be correlated. In this paper, we present a very simple and intuitive method based on speckle interferometry to measure out-of-plane displacements on specular reflecting surfaces that generate no speckle patterns. The method consists in a modified digital speckle pattern interferometer which requires no special equipment other than that used in conventional speckle interferometers. The proposed method could find useful application in the measurement of thermal deformation of mirrors.

Applied Physics,Optics
Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry

Xide Li,Gang Tao,Yizhang Yang

DOI: https://doi.org/10.1016/S0030-3992(00)00117-1

IF: 4.939

2001-01-01

Optics & Laser Technology

Abstract:If a laser beam illuminates a continual deformation object surface, it will lead to a temporal speckle pattern on the observation plane. Recording this time-dependent speckle pattern the deformation of the surface of an object can be obtained. Two methods, scanning phase method (SPM) and time sequence phase method (TSPM), have been introduced for measuring the displacement caused by the deformation in temporal speckle pattern interferometry (TSPI). Their principle is that by capturing a series of speckle interference patterns related to the object deformations, the fluctuations in the intensity of the interference patterns can be obtained. Through scanning these fluctuations and estimating both the average intensity and modulation of the temporal speckle interference patterns, the phase maps for whole-field displacements are calculated. In this way one is capable of quantitatively measuring continual displacements simply using a conventional electronic speckle pattern interferometry (ESPI) system without phase shifting or a carrier. The elaboration on the new methods is given in this paper and experiments are performed to demonstrate their performance with a conventional ESPI system.

New speckle pattern interferometry for precise in situ deformation measurements

Speckle technique applied to precise measurement of strain

Simultaneous 3D measurement of deformation and its first derivative with speckle pattern interferometry and shearography

On-Site Dynamic Deformation Measurements Based on Enhanced Temporal Speckle Pattern Interferometry

The Research of Speckle Technique in Deformation Measurement Fields

Simultaneous measurement of three-dimensional deformation based on digital speckle pattern interferometry technology

Fabrication of Micro-Scale Speckle Pattern and Its Applications for Deformation Measurement

Surface Patterning for Multi-Scale Strain Analysis of In-Situ Sem Mechanical Experiments

Application of the Speckle Technique for Three-Dimensional Deformation Measurement

Deformation Measurement of A Small Component and A Thin Film Using Time Sequence Speckle Pattern Interferometry

Dynamic deformation measurement with 2-frame phase-shifting speckle interferometry based on speckle statistics and wavefront multiplexing

Real-Time One-Point Out-Of-Plane Displacement Measurement System Using Electronic Speckle Pattern Interferometry

Measurement of out-of-plane deformation by combination of speckle photography and speckle shearing interferometry

High-Precision Large Deflection Measurements of Thin Films Using Time Sequence Speckle Pattern Interferometry

High Speed Deformation Measurement Using Digital Speckle Correlation Method

Deformation analysis with temporal speckle pattern interferometry

Accurate Dynamic 3D Deformation Measurement Based on the Synchronous Multiplexing of Polarization and Speckle Metrology

Direct strain measurement method based on the correlation of defocused laser speckle pattern

Digital Speckle Pattern Interferometry for Observing the Entire Process of Plastic Deformation of a Solid Object

Measuring micro-displacements of specular surfaces using speckle interferometry

Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry