Abstract:Evanescent-wave microscopy achieves sub-diffraction axial sectioning by confining fluorescence excitation to a thin layer close to the cell/substrate interface. How thin this light sheet exactly is, however, is often unknown. Particularly in the popular objective-type total internal reflection fluorescence microscopy (TIRFM) configuration large deviations from the expected exponential intensity decay of the evanescent wave have been reported. Propagating, i.e., non-evanescent, excitation light diminishes the optical sectioning effect, reduces contrast and renders the quantification of TIRFM images uncertain. Here, we use a combination of azimuthal- and polar-angle beam scanning, dark-field scatter imaging, and atomic force microscopy to identify the sources of this unwanted background fluorescence excitation. We identify stray light originating from the microscope optics and the objective lens itself as the major sources of background, with minor contributions due to evanescent-wave scattering at the reflecting interface and at refractive-index boundaries in the sample. Apart from evanescence in excitation light, light emitted from a fluorophore can also show observable effects of evanescence. Only fluorophores located close to the coverslip can couple their near-field radiation into propagating waves detectable at supercritical angles. We show that selectively detecting this supercritical-angle fluorescence (SAF) through a high-numerical aperture objective effectively rejects fluorescence from deeper sample regions and improves optical sectioning. The microscopy scheme presented here merges the benefits of TIRF excitation and SAF detection and provides the conditions for quantitative wide-field imaging of fluorophore dynamics at or near the plasma membrane.

Phase-diversity-based wavefront sensing for fluorescence microscopy

Phase diversity-based wavefront sensing for fluorescence microscopy

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Phase Microscopy Using Light-Field Reconstruction Method for Cell Observation

Experimental study for a field diversity phase retrieval wavefront sensing approach

Multiplexed wavefront sensing with a thin diffuser

Single-shot quantitative phase-fluorescence imaging using cross-grating wavefront microscopy

Multiplexed phase-space imaging for 3D fluorescence microscopy

Computational Optical Sectioning by Phase-Space Imaging with an Incoherent Multiscale Scattering Model

Snapshot coherence-gated direct wavefront sensing for multi-photon microscopy

Fluorescence microscopy beyond the ballistic regime by ultrasound pulse guided digital phase conjugation

Non-invasive focusing and imaging in scattering media with a fluorescence-based transmission matrix

Widefield fluorescence microscopy with sensor-based conjugate adaptive optics using oblique back illumination

Combined evanescent-wave excitation and supercritical-angle fluorescence detection improves optical sectioning

Simple Accurate Model-Based Phase Diversity Phase Retrieval Algorithm for Wavefront Sensing in High-Resolution Optical Imaging Systems.

Optical Aberration Correction via Phase Diversity and Deep Learning

Simultaneous Fluorescence And Quantitative Phase Microscopy With Single-Pixel Detectors

Noninvasive linear fluorescence imaging through scattering media via wavefront shaping

Accessible quantitative phase imaging in confocal microscopy with sinusoidal-phase synthetic optical holography

Phase imaging by spatial wavefront sampling