Dynamic Localization and Transient Profile Reconstruction of Internal Defect Based on a Dual-Channel Speckle Interferometer

Tianyu Yuan,Xiangjun Dai,Kang Wei,Fujun Yang
DOI: https://doi.org/10.1109/tim.2024.3385813
IF: 5.6
2024-04-16
IEEE Transactions on Instrumentation and Measurement
Abstract:The transient response of the internal defect is measured using the dual-channel speckle interferometer (DCSI) based on a high-speed camera (HSC) and the dual-biprism (DB). The systematic errors caused by the pose of the DB and the distortion of the lens are considered. An in-depth evaluation of the imaging errors caused by the arbitrary pose of the DB is performed using the model of virtual points. Internal defect in the structure under multiple loads is precisely localized by calibrating the lens distortion. Temporal speckle pattern interferometry (SPI) based on the Hilbert transform is used for pixel-by-pixel phase calculation. The transient centroid of the internal defect is localized by the first-order derivative, and the profile is reconstructed using out-of-plane displacement. This proposed method provides an accurate visualization of the transient response of internal defects in nonedge clamping.
engineering, electrical & electronic,instruments & instrumentation
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