Abstract:After graphene was first exfoliated in 2004, research worldwide has focused on discovering and exploiting its distinctive electronic, mechanical, and structural properties. Application of the efficacious methodology used to fabricate graphene, mechanical exfoliation followed by optical microscopy inspection, to other analogous bulk materials has resulted in many more two-dimensional (2D) atomic crystals. Despite their fascinating physical properties, manual identification of 2D atomic crystals has the clear drawback of low-throughput and hence is impractical for any scale-up applications of 2D samples. To combat this, recent integration of high-performance machine-learning techniques, usually deep learning algorithms because of their impressive object recognition abilities, with optical microscopy have been used to accelerate and automate this traditional flake identification process. However, deep learning methods require immense datasets and rely on uninterpretable and complicated algorithms for predictions. Conversely, tree-based machine-learning algorithms represent highly transparent and accessible models. We investigate these tree-based algorithms, with features that mimic color contrast, for automating the manual inspection process of exfoliated 2D materials (e.g., MoSe2). We examine their performance in comparison to ResNet, a famous Convolutional Neural Network (CNN), in terms of accuracy and the physical nature of their decision-making process. We find that the decision trees, gradient boosted decision trees, and random forests utilize physical aspects of the images to successfully identify 2D atomic crystals without suffering from extreme overfitting and high training dataset demands. We also employ a post-hoc study that identifies the sub-regions CNNs rely on for classification and find that they regularly utilize physically insignificant image attributes when correctly identifying thin materials.

Machine Learning-Assisted Identification of Single-Layer Graphene via Color Variation Analysis

Machine Learning-based Automatic Graphene Detection with Color Correction for Optical Microscope Images

Classifying optical microscope images of exfoliated graphene flakes by data-driven machine learning

Pixel-wise classification in graphene-detection with tree-based machine learning algorithms

Identification and classification of exfoliated graphene flakes from microscopy images using a hierarchical deep convolutional neural network

Machine-Learning-Enabled Fast Optical Identification and Characterization of 2D Materials

Optical Methods for Determining Thicknesses of Few-Layer Graphene Flakes

Total Color Difference for Rapid and Accurate Identification of Graphene

A High Throughput and Unbiased Machine Learning Approach for Classification of Graphene Dispersions

Large-Area High-Throughput Identification and Quality Control of Graphene and Few-Layer Graphene: Prospects of Industry-Scale Applications

Fast and accurate robotic optical detection of exfoliated graphene and hexagonal boron nitride by deep neural networks

Rapid determination of the thickness of graphene using the ratio of color difference

Physically informed machine-learning algorithms for the identification of two-dimensional atomic crystals

Identifying charge density and dielectric environment of graphene using Raman spectroscopy and deep learning

Intelligent Identification of Two-Dimensional Structure by Machine-Learning Optical Microscopy

Optical image-based thickness characterization of atomically thin nanomaterials using computer vision techniques

Automatic detection of multilayer hexagonal boron nitride in optical images using deep learning-based computer vision

Rapid and reliable thickness identification of two-dimensional nanosheets using optical microscopy.

MaskTerial: A Foundation Model for Automated 2D Material Flake Detection

Machine Learning-Based Detection of Graphene Defects with Atomic Precision

Automated Tabletop Exfoliation and Identification of Monolayer Graphene Flakes