Ultra-thin silicon oxide tunnel layer passivated contacts for screen-printed n-type industry solar cells
Ying Zhou,Dongming Zhao,Xiangrui Yu,Menglei Li,Zhiguo Zhao,Chuanke Chen,Zizhen Lin,Lichuang Wang,Xiongfei Chen,Xiaolei Li,Haiwei Huang,Rui Li,Zhidan Hao,Yun Liu,Jingkai Niu,Yao Xue
DOI: https://doi.org/10.1016/j.solmat.2023.112657
IF: 6.9
2023-12-02
Solar Energy Materials and Solar Cells
Abstract:Effects of the ultra-thin silicon oxide (SiO x ) on tunnel oxide passivated contact solar cells (TOPCon) are investigated in this paper. The experiment is fabricated to study the TOPCon electrical performance with different SiO x thickness and the champion efficiency is achieved by the TOPCon with a 1.5 nm SiO x layer, with V oc 698.93 mV, J sc 40.14 mA/cm 2 , FF 81.03 and efficiency 22.73 %. For futher understanding, EDNA2 and AFORS-HET are used to simulate the relationship between the SiO x thickness, rear SRV and the doping concentration in n + layer. It indicates that the total J 0 at the SiO x -(c-Si) interface (J 0, interface ) can be affected by the phosphorus concentration at the SiO x -(c-Si) interface. Besides, due to the variation of SRV or P-doped concentration, different recombination mechanisms , including auger recombination and surface recombination, will dominant the total J 0, interface . In addition, the sensitivity of TOPCon solar cells electrical performance to SiO x thickness can be affected by rear SRV, and the sensitivity of TOPCon solar cells electrical performance to rear SRV can be affected by SiOx thickness.
materials science, multidisciplinary,physics, applied,energy & fuels