Intelligent Inspection Technology of Substation Secondary System Based on Machine Vision

Sheng Jin,Jianjun Yin,Jie Zhou,Yihang Cai,Yanwei Hu
DOI: https://doi.org/10.1088/1742-6596/2428/1/012034
2023-02-24
Journal of Physics: Conference Series
Abstract:To solve the problems of low efficiency and poor precision in the current inspection of substation secondary systems, machine vision technology is introduced to conduct the design and research of inspection technology. It acquires equipment images and manufactures an image data set of that secondary system equipment of the transformer substation. It also processes and segments an inspection guideline image using machine vision technology and realizes itinerant inspection of the secondary system instrument equipment of the transformer substation based on the acquired inspection image. The comparative experiments show that the efficiency and accuracy of the new inspection technology have been significantly improved.
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