Ultrahigh evaporative heat transfer measured locally in submicron water films

Xiaoman Wang,S. Arman Ghaffarizadeh,Xiao He,Alan J. H. McGaughey,Jonathan A. Malen

DOI: https://doi.org/10.1038/s41598-022-26182-2

IF: 4.6

2022-12-27

Scientific Reports

Abstract:Thin film evaporation is a widely-used thermal management solution for micro/nano-devices with high energy densities. Local measurements of the evaporation rate at a liquid-vapor interface, however, are limited. We present a continuous profile of the evaporation heat transfer coefficient ( ) in the submicron thin film region of a water meniscus obtained through local measurements interpreted by a machine learned surrogate of the physical system. Frequency domain thermoreflectance (FDTR), a non-contact laser-based method with micrometer lateral resolution, is used to induce and measure the meniscus evaporation. A neural network is then trained using finite element simulations to extract the profile from the FDTR data. For a substrate superheat of 20 K, the maximum is  MW/ -K at a film thickness of  nm. This ultrahigh value is two orders of magnitude larger than the heat transfer coefficient for single-phase forced convection or evaporation from a bulk liquid. Under the assumption of constant wall temperature, our profiles of and meniscus thickness suggest that 62% of the heat transfer comes from the region lying 0.1–1 μm from the meniscus edge, whereas just 29% comes from the next 100 μm.

multidisciplinary sciences