Abstract:The capability of machine learning methods for identifying and separating artifacts that appear in a typical X‐ray diffraction image is demonstrated.In situ synchrotron high‐energy X‐ray powder diffraction (XRD) is highly utilized by researchers to analyze the crystallographic structures of materials in functional devices (e.g. battery materials) or in complex sample environments (e.g. diamond anvil cells or syntheses reactors). An atomic structure of a material can be identified by its diffraction pattern along with a detailed analysis of the Rietveld refinement which yields rich information on the structure and the material, such as crystallite size, microstrain and defects. For in situ experiments, a series of XRD images is usually collected on the same sample under different conditions (e.g. adiabatic conditions) yielding different states of matter, or is simply collected continuously as a function of time to track the change of a sample during a chemical or physical process. In situ experiments are usually performed with area detectors and collect images composed of diffraction patterns. For an ideal powder, the diffraction pattern should be a series of concentric Debye–Scherrer rings with evenly distributed intensities in each ring. For a realistic sample, one may observe different characteristics other than the typical ring pattern, such as textures or preferred orientations and single‐crystal diffraction spots. Textures or preferred orientations usually have several parts of a ring that are more intense than the rest, whereas single‐crystal diffraction spots are localized intense spots owing to diffraction of large crystals, typically >10 μm. In this work, an investigation of machine learning methods is presented for fast and reliable identification and separation of the single‐crystal diffraction spots in XRD images. The exclusion of artifacts during an XRD image integration process allows a precise analysis of the powder diffraction rings of interest. When it is trained with small subsets of highly diverse datasets, the gradient boosting method can consistently produce high‐accuracy results. The method dramatically decreases the amount of time spent identifying and separating single‐crystal diffraction spots in comparison with the conventional method.

Automated Data Analysis for Powder X-Ray Diffraction Using Machine Learning

Symmetry prediction and knowledge discovery from X-ray diffraction patterns using an interpretable machine learning approach

Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis

Artifact Identification in X-ray Diffraction Data using Machine Learning Methods

Adaptively driven X-ray diffraction guided by machine learning for autonomous phase identification

Rapid detection of rare events from in situ X-ray diffraction data using machine learning

Exploring Supervised Machine Learning for Multi-Phase Identification and Quantification from Powder X-Ray Diffraction Spectra

Artifact identification in X‐ray diffraction data using machine learning methods

Towards end-to-end structure determination from x-ray diffraction data using deep learning

Enhancing deep-learning training for phase identification in powder X-ray diffractograms

Machine learning-assisted close-set X-ray diffraction phase identification of transition metals

Analysis of extended X-ray absorption fine structure (EXAFS) data using artificial intelligence techniques

Fast and interpretable classification of small X-ray diffraction datasets using data augmentation and deep neural networks

A probabilistic deep learning approach to automate the interpretation of multi-phase diffraction spectra

A Deep Learning Approach to Powder X‐Ray Diffraction Pattern Analysis: Addressing Generalizability and Perturbation Issues Simultaneously

Machine Learning Automated Approach for Enormous Synchrotron X-Ray Diffraction Data Interpretation

Integrated analysis of X-ray diffraction patterns and pair distribution functions for machine-learned phase identification

Towards a machine-readable literature: finding relevant papers based on an uploaded powder diffraction pattern

Towards scanning nanostructure X‐ray microscopy

Machine Learning Automated Analysis of Enormous Synchrotron X-ray Diffraction Datasets