Pulse-Mediated Electronic Tuning of the MoS 2 –Perovskite Ferroelectric Field Effect Transistors

Kai-Wen Chen,Shu-Jui Chang,Ethan Ying-Tsan Tang,Chih-Pin Lin,Tuo-Hung Hou,Chia-Hao Chen,Yuan-Chieh Tseng
DOI: https://doi.org/10.1021/acsaelm.0c00676
IF: 4.494
2020-11-24
ACS Applied Electronic Materials
Abstract:This paper reports on the fabrication of a ferroelectric field effect transistor (FeFET) using a monolayer MoS<sub>2</sub> film and a perovskite GdNi<sub>0.2</sub>Fe<sub>0.8</sub>O<sub>3</sub> (GFNO) ferroelectric film. We demonstrate the tuning of electrical characteristics using pulse voltage to evoke a 2H–1T′ phase transition in the MoS<sub>2</sub>. Coupling at the MoS<sub>2</sub>–GFNO interface is the mechanism responsible for the electronic tuning. Locally reversing the ferroelectric polarization of the perovskite GFNO through the application of pulse voltage makes it possible to manipulate the carrier concentration and associated phase of the MoS<sub>2</sub> via heterostructure interactions. Our experiment results are supported by free energy calculations pertaining to heterostructures under the effects of an electric field. Analysis of the nonvolatile properties of the FeFET using the scanning probe method and scanning photoelectron spectroscopy revealed that the transition indeed occurred across much of the device landscape. The design established in this study paves the way to the development of laterally two-dimensional FeFET, which could provide nonvolatile characteristics with a less destructive read–write process.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsaelm.0c00676?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsaelm.0c00676</a>.Figures S1–S8: additional information for GFNO characterizations; PL and XPS fitting results of MOS<sub>2</sub>/GFNO device; Table S1: parameters of Helmholtz free energy calculation; Table S2: information related to differences in binding energy in <a class="internalNav" href="#fig7">Figure </a><a class="internalNav" href="#fig7">7</a>b,c; eq S1: numerical estimation for electron density (<a class="ext-link" href="/doi/suppl/10.1021/acsaelm.0c00676/suppl_file/el0c00676_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
materials science, multidisciplinary,engineering, electrical & electronic
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