First‐Principles Calculation Design for 2D Perovskite to Suppress Ion Migration for High‐Performance X‐ray Detection

Bobo Zhang,Zhuo Xu,Chuang Ma,Haojin Li,Yucheng Liu,Lili Gao,Jing Zhang,Jiaxue You,Shengzhong (Frank) Liu
DOI: https://doi.org/10.1002/adfm.202110392
IF: 19
2021-12-29
Advanced Functional Materials
Abstract:Ion migration is a key root‐cause of photocurrent instability in perovskite X‐ray detectors. Although 2D perovskite single crystal (PSC) is a good candidate to suppress ion migration compared with its 3D counterpart, its intrinsic stability still needs to be improved. In this work, it is first envisioned to conquer the ion migration by enhanced chemical bonding; the proposal is further confirmed by density functional theory calculations, in which the bonds are made stronger by introducing a fluorine atom into the ortho position of phenethylamine (o‐F‐PEA) to shorten the distance between adjacent organic cations in the crystal lattice for enhanced electrostatic interactions between the F atom and the neighboring benzene ring. It is further demonstrated experimentally that the activation energy for ion migration (AEIM) of (o‐F‐PEA)2PbI4 PSC is increased compared with that of (PEA)2PbI4 PSC. The improved AEIM is also confirmed by enhanced thermal stability. Consequently, the dark current in the (o‐F‐PEA)2PbI4 2D PSC X‐ray detectors is reduced by two times compared with the (PEA)2PbI4 reference. Furthermore, the detector shows the sensitivity of 1724.5 μC Gyair−1 cm−2 at 1250 V mm−1, and much improved photocurrent stability. A new 2D perovskite single crystal is designed by a novel principle that a stronger interaction between fluorined organic macromolecules and [Pb6]4− octahedron are beneficial for suppressed ion migration, enhanced carrier mobility, improved carrier lifetime, lowered dark current, and further sensitive and stable X‐ray detection.
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
What problem does this paper attempt to address?