Precision measurement of a potential-profile tunable single-electron pump

Myung-Ho Bae,Ye-Hwan Ahn,Minky Seo,Yunchul Chung,J D Fletcher,S P Giblin,M Kataoka,Nam Kim
DOI: https://doi.org/10.1088/0026-1394/52/2/195
2015-02-05
Metrologia
Abstract:We performed a precision measurement of the current from a single-parameter electron pump, where the potential-profile for a quantum dot was manipulated by multiple top-metal gates. In an optimally tuned condition, driven with a sinusoidal-waveform microwave at f = 0.95 GHz, B = 11 T, and T = 0.3 K, the relative deviation of the pump current from ef, δIp/ef ≡ (Ip − ef)/ef was measured to be (−0.92 ± 1.37) ppm. Our experiment reproduces the current quantisation accuracy of a previous measurement of a single-parameter pump, but in a device fabricated using very different geometry, thereby indicating that accurate single-parameter pumping is insensitive to device details.
instruments & instrumentation,physics, applied
What problem does this paper attempt to address?