XPS Investigations on Solid and Vacuum Deposited, Oxidized and Non-oxidized Palladium

Jürgen Kintrup,Harald Züchner
DOI: https://doi.org/10.1515/zna-1995-4-510
1995-05-01
Zeitschrift für Naturforschung A
Abstract:Abstract X-ray photoelectron spectroscopy (XPS) has been carried out to study the reaction of differently prepared palladium samples (solid and film Pd) with atmospheric oxygen. A careful curve fitting of the measured Pd-3d 5/2 peak allows to separate the Pd-3d 5/2 peak for Pd in surface PdO from the dominant Pd-3d 5/2 peak of the non-oxidized bulk palladium and to determine the chemical shift of the "oxidized" Pa line with high accuracy. Differences in the chemical shifts for the surface PdO on solid and film palladium are explained by a different charging caused by the photoelectric effect in XPS measurements. The smaller charging effect observed for film palladium as compared to solid palladium indicates a stronger oxygen bonding to the (rougher) film palladium. The strong Pd-O bonding seems to be an essential reason for the reduced hydrogen-permeability of film palladium compared to solid palladium
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