Partial Valence Densities-of-States of TiO2 and TiO2-x from Resonant Photoemission and Photoelectron Diffraction

R. Heise,R. Courths
DOI: https://doi.org/10.1007/978-3-642-78632-7_9
1993-01-01
Abstract:The use of resonant photoemission (ResPE), X-ray excited photoelectron diffraction (XPED) and inverse photoemission from TiO2(110) (rutile) surfaces for the determination of partial (atom-resolved) densities-of- states of valence and conduction electrons is reported. The hybridization between O 2p and Ti orbitals (3d and 4s) extends over the whole valence band. Positions and splitting of the empty Ti 3d states are given. Three occupied defect states with titanium character are detected in oxygen deficient surfaces.
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