Abstract:For a century, x-ray crystallography has been conducted with one of the two extreme sample conditions: either a single crystal which produces a single set of diffraction spots directly corresponding to the geometric orientation of the crystal, or a powder sample which comprises a huge number of crystals so numerous that the diffraction spots overlap and merge into smooth rings while the geometric relation is completely lost and only the d-spacings information of diffraction planes is observed. High-pressure DAC is not optimized for either condition. Powder x-ray diffraction has the intrinsic limitations when the sample consists of multiple different phases with low symmetry. Diffraction rings cover most of the detector area, and only a couple of low angle diffraction rings are unique to a phase; most other rings overlap with one another and cannot be used for unique identiﬁcation or accurate determination of crystallographic parameters. New structures and minor phases are often overshadowed by the diffraction of major phases and are impossible to ﬁnd or identify. Advanced crystallographic software, such as Rietveld and LeBail reﬁnement methods, may get most out of a powder pattern, but cannot overcome the intrinsic limitations. In addition, the common practice of integrating the 2D ring into a 1D peak plot throws away the valuable information of a whole dimension, such as the azimuthal angle of diffraction spot around the ring. Single-crystal XRD contains orientation and geometrical relationship in addition to d-spacings and thus provides a deﬁnitive characterization of the unit cell and symmetry. Unless the crystal is orientated exactly relative to the incident monochromatic x-ray beam to satisfy the Bragg relation, the crystal gives no signal, and the detector remains empty. Rotating the crystal around the w-axis (perpendicular to the incident x-ray beam) can bring the crystal to Bragg condition and occasionally obtain single diffraction spots at a given angle and scanning step. In spite of the advantages, single crystal cannot be sustained through phase transitions and often breaks down into multiple crystals and generate spotty XRD patterns. Spottiness, that is generally regarded as a ﬂaw in powder XRD, can be turned into great advantages if we can separate individual crystallites and handle them as individual single crystals. The high-brilliance x-ray beam available at synchrotron facilities has made it possible to collect diffraction spots in a powder sample comprised of up to hundreds of submicron crystallites. The newly developed Multigrain Crystallography (MGC) package, which is a suite of programs used for processing and indexing diffraction spots, has been developed to separate and identify the crystallographic orientation of each individual crystallite in the aggregate of hundreds of crystallites. Once separated, the data set for each crystallite can be handled with the standard single-crystal reﬁnement program identical to a stand-alone single crystal, resulting in excellent statistics in reﬁnement and full coverage of the reciprocal space. The MGC method is very powerful in unequivocal determination of symmetry and unit cells, testing different indexing models, picking out minor phases, and resolving strain of individual crystallites, and will very likely replace the powder and single-crystal x-ray diffraction methods as the dominant crystallographic tool for future high pressure-temperature studies in DAC.

Three-dimensional X-ray diffraction in the diamond anvil cell: application to stishovite

Two-dimensional Energy Dispersive X-Ray Diffraction at High Pressures and Temperatures

Coherent diffraction imaging of nanoscale strain evolution in a single crystal under high pressure

In situ synchrotron X-ray multimodal experiment to study polycrystal plasticity

Energy dispersive x-ray diffraction of micro-crystals at ultrahigh pressures

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

Full stress tensor measurement using colour centres in diamond

New Condensed Matter Probes for Diamond Anvil Cell Technology

High-precision mapping of diamond crystal strain using quantum interferometry

A Focusing System for X-ray Diffraction Studies of Materials under High Pressure in the Diamond Cell

X-Ray Imaging Of Stress And Strain Of Diamond, Iron, And Tungsten At Megabar Pressures

Stroboscopic X-ray Diffraction Microscopy of Dynamic Strain in Diamond Thin-film Bulk Acoustic Resonators for Quantum Control of Nitrogen Vacancy Centers

Use of a confocal optical device for centring a diamond anvil cell in single‐crystal X‐ray diffraction experiments

A Scanning Angle Energy-Dispersive X-Ray Diffraction Technique for High-Pressure Structure Studies in Diamond Anvil Cells

Exploiting Friedel pairs to interpret scanning 3DXRD data from complex geological materials

New diamond cell for single-crystal x-ray diffraction

A new compact symmetric rotational diamond anvil cell for in situ high-pressure-torsion studies

Imaging crystal stress in diamond using ensembles of nitrogen-vacancy centers

Simulations of x-ray diffraction from uniaxially-compressed highly-textured polycrystalline targets

High-energy coherent X-ray diffraction microscopy of polycrystal grains: first steps towards a multi-scale approach

Three-dimensional X-ray structural microscopy with submicrometre resolution