A PoF Based Reliability Assessment Framework for Complex Systems

Qian Li,Yaqiu Li,Guangze Pan,Jiawei Zhu,Baimao Lei,Xiaobing Li,JiaWei Zhu
DOI: https://doi.org/10.1109/icrms.2018.00084
2018-10-01
Abstract:Failure mechanisms are the root cause of product failure, and describes the internal physical and chemical process during a products’ lifetime, reflecting the relationship between internal variables and product life under specific circumstances. By modelling the failure mechanism of parts or components, designers can quantify the reliability of device-level and predict remaining lifespan without requiring abundant history failure data. This is significant in developing the failure mechanism modelling method for the use in system failures. Based on the physics of failure, this study proposes a system level reliability evaluation framework which considers the physics of failure mechanisms, and describes an evaluation method based on Bayesian inference, which was tested using typical threshold dynamic parameters of system failure.
What problem does this paper attempt to address?