A HEMT-based cryogenic charge amplifier with sub-100 eVee ionization resolution for massive semiconductor dark matter detectors

A. Phipps,A. Juillard,B. Sadoulet,B. Serfass,Y. Jin
DOI: https://doi.org/10.1016/j.nima.2019.06.022
2019-10-01
Abstract:<p>We present the measured baseline ionization resolution of a HEMT-based cryogenic charge amplifier coupled to a CDMS-II detector. The amplifier has been developed to allow massive semiconductor dark matter detectors to retain background discrimination at the low recoil energies produced by low-mass WIMPs. We find a calibrated baseline ionization resolution of <span class="math"><math>σE=91eVee</math></span>. To our knowledge, this is the best direct ionization resolution achieved with such massive (<span class="math"><math>≈</math></span>150 pF capacitance) radiation detectors.</p>
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