Finite Element Analysis Model on Ultrasonic Phased Array Technique for Material Defect Time of Flight Diffraction Detection

Hanxin Chen,Dongliang Fan,Jinmin Huang,Wenjian Huang,Guangyu Zhang,Lang Huang
DOI: https://doi.org/10.1166/sam.2020.3689
2020-05-01
Science of Advanced Materials
Abstract:In this study, the finite element method (FEM) for phased array technology in ultrasonic time of flight diffraction (TOFD) for the defect detection of two-dimensional (2-D) geometric materials was researched. The phased array technology generated the FEM model for the TOFD signal. We have established the finite element model by the FEM software ANSYS based on the ultrasonic mechanism about the defects and the phased array transducer. A plane strain elements have simulated the reflected signal of the defect. We can compare the error ratio between simulation and experiment by using the theoretical calculation value as the benchmark, and find the feasibility of the FEM detection.
materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology
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