In Operando Monitoring by Analysis of Backscattered Electrons during Electron Beam Melting

Christopher Arnold,Jonas Böhm,Carolin Körner
DOI: https://doi.org/10.1002/adem.201901102
IF: 3.6
2019-12-15
Advanced Engineering Materials
Abstract:Additive manufacturing by electron beam melting (EBM) is a complex process, which still lacks reliable tools for process monitoring. Demanding processing conditions such as high temperature, high vacuum and X‐ray radiation impede the continuous operation of standard process monitoring devices like light‐optical camera systems. To overcome this deficit, detection of backscattered electrons is a highly promising approach. A detection system for backscattered electrons is used for recording the in‐operando signal during melting inside an EBM system. The acquired data is post‐processed by mapping the data‐points to spatial coordinates. A comparison between the obtained intensity map and the as‐built surface shows a remarkable correlation, which might be suitable for process monitoring and quality control purposes.This article is protected by copyright. All rights reserved.
materials science, multidisciplinary
What problem does this paper attempt to address?