Abstract:We present a new comprehensive mathematical model of the cone-shaped cantilever tip-sample interaction in Atomic Force Microscopy (AFM). The importance of such AFMs with cone-shaped cantilevers can be appreciated when its ability to provide high-resolution information at the nanoscale is recalled. It is an indispensable tool in a wide range of scientific and industrial fields. The interaction of the cone-shaped cantilever tip with the surface of the specimen (sample) is modeled by the damped Euler-Bernoulli beam equation $ \rho_A(x)u_{tt} $ $ +\mu(x)u_{t}+(r(x)u_{xx}+\kappa(x)u_{xxt})_{xx} = 0 $, $ (x, t)\in (0, \ell)\times (0, T) $, subject to the following initial, $ u(x, 0) = 0 $, $ u_t(x, 0) = 0 $ and boundary, $ u(0, t) = 0 $, $ u_{x}(0, t) = 0 $, $ \left (r(x)u_{xx}(x, t)+\kappa(x)u_{xxt} \right)_{x = \ell} = M(t) $, $ \left (-(r(x)u_{xx}+\kappa(x)u_{xxt})_x\right)_{x = \ell} = g(t) $ conditions, where $ M(t): = 2h\cos \theta\, g(t)/\pi $ is the moment generated by the transverse shear force $ g(t) $. Based on this model, we propose an inversion algorithm for the reconstruction of an unknown shear force in the AFM cantilever. The measured displacement $ \nu(t): = u(\ell, t) $ is used as additional data for the reconstruction of the shear force $ g(t) $. The least square functional $ J(F) = \frac{1}{2}\Vert u(\ell, \cdot)-\nu \Vert_{L^2(0, T)}^2 $ is introduced and an explicit gradient formula for the Fréchet derivative of the cost functional is derived via the weak solution of the adjoint problem. Additionally, the geometric parameters of the cone-shaped tip are explicitly contained in this formula. This enables us to construct a gradient based numerical algorithm for the reconstructions of the shear force from noise free as well as from random noisy measured output $ \nu (t) $. Computational experiments show that the proposed algorithm is very fast and robust. This creates the basis for developing a numerical "gadget" for computational experiments with generic AFMs.

Toward an Improved Method for Determining the Hamaker Constant of Solid Materials Using Atomic Force Microscopy. I. Quasi-Static Analysis for Arbitrary Surface Roughness

A method to quantitatively evaluate Hamaker constant using the jump-into-contact effect in Atomic Force microscopy

Towards High Accuracy Surface Profile Characterization in Atomic Force Microscopy

AFM-based Hamaker Constant Determination with Blind Tip Reconstruction

Calibration of the Effective Spring Constant of Ultra-Short Cantilevers for A High-Speed Atomic Force Microscope

A comprehensive study of AFM stiffness measurements on inclined surfaces: theoretical, numerical, and experimental evaluation using a Hertz approach

A novel contact model for AFM indentation experiments on soft spherical cell-like particles.

Quantitative determination of surface energy using atomic force microscopy: the case of hydrophobic/hydrophobic contact and hydrophilic/hydrophilic contact

J0610104 Evaluation of Interatomic Force on the Tip of Probe by Using Microwave Atomic Force Microscope

Contact Stiffness and Damping in Atomic-Scale Friction: An Approximate Estimation from Molecular Dynamics Simulations

OS1508 Investigation of Interatomic Force under the Tip of Microwave-AFM Probe

AFM Indentation on Highly Heterogeneous Materials Using Different Indenter Geometries

Direct Measurement of Plowing Friction and Wear of a Polymer Thin Film Using the Atomic Force Microscope

Several Fundamental Problems in Hydrophobic Force Measurements by Using AFM

Quantitative Formulation of Frequency-Dependent Average Force in AM-AFM

Validation of contact mechanics models for Atomic Force Microscopy via Finite Elements Analysis

Method for the calculation of the Hamaker constants of organic materials by the Lifshitz macroscopic approach with DFT

Atomic force microscopy calibration of standing surface acoustic wave amplitudes

Investigation of Near-Surface Mechanical Properties of Materials Using Atomic Force Microscopy

Accurate Modelling of AFM Force-Indentation Curves with Blunted Indenters at Small Indentation Depths

Reconstruction of shear force in Atomic Force Microscopy from measured displacement of the cone-shaped cantilever tip