Special Section on the 14th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII2019)

Masato Aketagawa
DOI: https://doi.org/10.1088/1361-6501/ab97fa
IF: 2.398
2020-09-09
Measurement Science and Technology
Abstract:Nothing that cannot be measured or controlled can be made in the manufacturing process. In order to develop ultra-precision processing represented by nanometer-level semiconductor and optical manufacturings, it is necessary to establish measurement and instrumentation that enable precise evaluation and control up to nanometer level. Therefore, measurement technology and intelligent instruments have been crucial for nano/micro fabrication and ultra-precision engineering. To advance the technologies for advanced manufacturing, the International Symposium Series on Measurement Technology and Intelligent Instruments have been held from 1989 [1]. The most recent one, the 14th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII2019) was held in Niigata, Japan, on September 1–5, 2019. This symposium focused on presenting the latest scientific and engineering breakthroughs to develop cutting-edge measurement technologies and intelligent instruments. This special issue of Measurement Science and Technology includes selected articles from all papers presented at ISMTII2017. We would like to thank all contributors to the symposium and to this special issue.The special issue collects eight articles [2, 9] from a wide range of fields of measurement technology and intelligent instruments. I believe the articles represent impressive contributions to the developing subjects.Finally, the next 15th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII2021) will be held in Nottingham, UK in September 2021.The guest editor of this special issue on Measurement Technology and Intelligent Instruments acknowledges the Technical Committee for Intelligent Nano-Measure of the Japanese Society for Precision Engineering and International Committee on Measurements and Instrumentation.
engineering, multidisciplinary,instruments & instrumentation
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