Charge transport mechanism in dielectrics: drift and diffusion of trapped charge carriers

Andrey A. Pil’nik,Andrey A. Chernov,Damir R. Islamov
DOI: https://doi.org/10.1038/s41598-020-72615-1
IF: 4.6
2020-09-25
Scientific Reports
Abstract:Abstract In this study, we developed a continuum theory of the charge transport in dielectrics by trapped electrons and holes, which takes into account two separate contributions of the current of trapped charge carriers: the drift part and the diffusion one. It was shown that drift current is mostly dominant in the bulk, while the diffusion one reaches significant values near contacts. A comparison with other theoretical models and experiments shows a good agreement. The model can be extended to two- and three-dimensional systems. The developed model, formulated in partial differential equations, can be numerically implemented in the finite element method code.
multidisciplinary sciences
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