Towards A Test Paths Generation Method for CTCS Level Transition

LI Yao,ZHANG Xiaoxia,ZHANG Yadong,GUO Jin,GAO Hao
DOI: https://doi.org/10.1051/matecconf/202032501001
2020-01-01
MATEC Web of Conferences
Abstract:Test case is an important basis for correctness and safety verification of Chinese Train Control System (CTCS). Focusing on the test cases generation method of UPPAAL which is widely used in CTCS testing activity, the problems are analyzed, and an improved test cases generation method for CTCS is proposed. First, the process and characteristics of UPPAAL test cases generation method are analyzed; then the test requirements of CTCS are studied, and a test cases generation method based on UPPAAL query file is proposed. Finally, taking the level transition function of CTCS as an example, test cases are generated by the proposed method, which shows that this method can meet the test requirements of CTCS.
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