A Test Case Design Method Based on Path Depth Coverage

Yunqiang Yan,Linbo Wu,Yanhong Peng,Changhai Nie
DOI: https://doi.org/10.1109/QRS-C.2019.00030
2019-01-01
Abstract:For the scientific coverage and sampling problems in the different levels of test designs based on the different risk levels of users in the complex embedded software system testing, the paper proposes a hierarchical system test modeling method based on SysML activity diagram, and designs a test case generation algorithm based on the path depth coverage, which effectively solves the test coverage design and generation under multiple constraint conditions (path coverage, data coverage and conditional combination coverage, etc.). Finally, the paper carries out the application verification of the entire process from the test modeling, data configuration, determination of the test coverage target to the automatic generation of a complete test case in combination with a typical embedded software system.
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