Attosecond metrology in a continuous-beam transmission electron microscope

A. Ryabov,J. W. Thurner,D. Nabben,M. V. Tsarev,P. Baum
DOI: https://doi.org/10.1126/sciadv.abb1393
IF: 13.6
2020-11-13
Science Advances
Abstract:Electron microscopy is advanced to attosecond resolution by modulating the beam with the field cycles of a continuous-wave laser.
multidisciplinary sciences
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