Terahertz-based Subfemtosecond Metrology of Relativistic Electron Beams

R. K. Li,M. C. Hoffmann,E. A. Nanni,S. H. Glenzer,M. E. Kozina,A. M. Lindenberg,B. K. Ofori-Okai,A. H. Reid,X. Shen,S. P. Weathersby,J. Yang,M. Zajac,X. J. Wang
DOI: https://doi.org/10.1103/physrevaccelbeams.22.012803
2019-01-01
Physical Review Accelerators and Beams
Abstract:We demonstrate single-shot temporal characterization of relativistic electron bunches using single-cycle terahertz (THz) field streaking. A transverse deflecting structure consisting of a metal slit enables efficient coupling of the THz field and electron bunch. The intrinsically stable carrier envelope phase and strong gradient of the THz pulses allow simultaneous, self-calibrated determination of the time-of-arrival with subfemtosecond precision and bunch duration with single-femtosecond precision, respectively, opening up new opportunities for ultrafast electron diffraction as well as accelerator technologies in general.
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