Abstract:Exponential degradation modeling and its variants have been widely used to describe component or device degradation characteristics, such as exponential bearing degradation, and their extrapolations to a predefined failure threshold can be used to predict remaining useful life (RUL). Previously, a pioneered Bayesian exponential degradation model with random coefficients was developed to integrate on-line condition monitoring data with prior model parameters distributions to obtain posterior model parameters distributions so as to better describe an individual exponential component degradation process. In this paper, a generalized exponential degradation model for a tradeoff between prior and posterior model parameters distributions is constructed to extend the previous pioneered exponential degradation model with random coefficients. Moreover, two new propositions are proposed to show that when hyperparameters used in the generalized exponential degradation model tend to 0, the posterior analytical parameters distributions of the generalized exponential degradation model are reduced to the posterior analytical parameters distributions of the previous pioneered exponential degradation model. When hyperparameters used in the generalized exponential degradation model tend to positive infinite, the posterior analytical parameters distributions of the generalized exponential degradation model are reduced to the prior model parameters distributions of the previous pioneered exponential degradation model. Overall, the proposed generalized exponential model can realize a tradeoff between prior and posterior model parameters distributions. Finally, simulated and experimental cases are studied to illustrate how the proposed generalized exponential model works and demonstrate its effectiveness and superiority to exponential bearing degradation and RUL prediction.

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