Ex Situ Residual Stress Analysis of Chemical Vapor Deposited Diamond Coated Cutting Tools by Synchrotron X‐Ray Diffraction in Transmission Geometry

Daniel Hinzmann,Katrin Böttcher,Walter Reimers,Eckart Uhlmann
DOI: https://doi.org/10.1002/adem.202001525
IF: 3.6
2021-05-03
Advanced Engineering Materials
Abstract:When machining difficult‐to‐cut, non‐ferrous materials, chemical vapor deposited (CVD) diamond coated cutting tools are applied. The tools' favorable mechanical property profile is based on the hardness of the coating as well as on the adaptability of the substrate. Nevertheless, the reproducibility of machining results and process stability are limited to insufficient coating adhesion. The resulting cutting tool failure is based on coating delamination initiated by crack development. By assessing residual stress as an influence of coating adhesion, an analysis of CVD‐diamond coated tools is performed by using synchrotron x‐ray diffraction in transmission geometry. The investigation of a nanocrystalline and multilayer morphology on cobalt based tungsten carbide (WC‐Co) and silicon nitride based ceramic (Si3N4) provides the distribution of the principal in‐plane residual stress tensor component σ22 depending on coating morphology and substrate material. Contrary to microcrystalline CVD diamond, nanocrystalline layers decrease the compressive residual stress. In addition, the CVD‐diamond coating deposited on Si3N4 substrate material tends to induce an overall initial tensile residual stress that leads to an increased tool performance compared to WC‐Co based coated tools. The variation of coating morphology as well as substrate material offers the possibility to extend the current model for residual stress dependent tool failure.This article is protected by copyright. All rights reserved.
materials science, multidisciplinary
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