A 3-D X-ray microtomographic system with a CMOS image sensor

Seung Wook Lee,Ho Kyung Kim,Gyuseong Cho,Young Hoon Shin,Ye Yeon Won
DOI: https://doi.org/10.1109/23.958387
IF: 1.703
2001-08-01
IEEE Transactions on Nuclear Science
Abstract:High-resolution and three-dimensional X-ray imaging is becoming more and more popular. An X-ray microtomographic system with a CMOS image sensor has been developed. We have developed a novel area X-ray detector with a cost-effective CMOS image sensor. The sensing area of the detector is 55 × 55 mm2 and the light from the phosphor screen is collected to the CMOS image sensor by a carefully designed optical system. Six lenses are assembled to reduce the radiation damage effect and increase the resolution and sensitivity. A microfocus X-ray tube that can reach up to 5 μm of focal spot size and microprecision motor system that can move in x–y–z directions for both alignment and magnification and rotate the object have been adopted. A conventional three-dimensional cone-beam Feldkamp reconstruction algorithm was used and a human cancellous bone has been imaged with this system. Currently, the resolution of this system is about 40 μm but the application in microtomography seems very promising using this CMOS X-ray detector.
engineering, electrical & electronic,nuclear science & technology
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