Abstract:A new facility for microdiffraction strain measurements and microfluorescence mapping has been built on beamline 12.3.2 at the advanced light source of the Lawrence Berkeley National Laboratory. This beamline benefits from the hard x-radiation generated by a 6 T superconducting bending magnet (superbend). This provides a hard x-ray spectrum from 5 to 22 keV and a flux within a 1 microm spot of approximately 5x10(9) photons/s (0.1% bandwidth at 8 keV). The radiation is relayed from the superbend source to a focus in the experimental hutch by a toroidal mirror. The focus spot is tailored by two pairs of adjustable slits, which serve as secondary source point. Inside the lead hutch, a pair of Kirkpatrick-Baez (KB) mirrors placed in a vacuum tank refocuses the secondary slit source onto the sample position. A new KB-bending mechanism with active temperature stabilization allows for more reproducible and stable mirror bending and thus mirror focusing. Focus spots around 1 microm are routinely achieved and allow a variety of experiments, which have in common the need of spatial resolution. The effective spatial resolution (approximately 0.2 microm) is limited by a convolution of beam size, scan-stage resolution, and stage stability. A four-bounce monochromator consisting of two channel-cut Si(111) crystals placed between the secondary source and KB-mirrors allows for easy changes between white-beam and monochromatic experiments while maintaining a fixed beam position. High resolution stage scans are performed while recording a fluorescence emission signal or an x-ray diffraction signal coming from either a monochromatic or a white focused beam. The former allows for elemental mapping, whereas the latter is used to produce two-dimensional maps of crystal-phases, -orientation, -texture, and -strain/stress. Typically achieved strain resolution is in the order of 5x10(-5) strain units. Accurate sample positioning in the x-ray focus spot is achieved with a commercial laser-triangulation unit. A Si-drift detector serves as a high-energy-resolution (approximately 150 eV full width at half maximum) fluorescence detector. Fluorescence scans can be collected in continuous scan mode with up to 300 pixels/s scan speed. A charge coupled device area detector is utilized as diffraction detector. Diffraction can be performed in reflecting or transmitting geometry. Diffraction data are processed using XMAS, an in-house written software package for Laue and monochromatic microdiffraction analysis.

A multipurpose end-station for atomic, molecular and optical sciences and coherent diffractive imaging at ELI beamlines

X-ray spectroscopy station for sample characterization at ELI Beamlines

Time-resolved crystallography of proteins at the femto second x-ray plasma source in eli beamlines

Full aperture backscatter diagnostics for characterization of laser plasma instabilities at the extreme light infrastructure (ELI) beamlines

A new user-friendly materials science end station at the FinEstBeAMS beamline of MAX IV

The Liquid Jet Endstation for Hard X-ray Scattering and Spectroscopy at the Linac Coherent Light Source

Dynamic loading platforms coupled to ultra-high speed X-ray imaging at beamline ID19 of the European Synchrotron ESRF

A versatile and transportable endstation for controlled molecule experiments

FlexPES: a versatile soft X-ray beamline at MAX IV Laboratory

Radiation Protection at ELI Beamlines: A Unique LaserDriven Accelerator Facility

The L4n laser beamline of the P3-installation: Towards high-repetition rate high-energy density physics at ELI-Beamlines

Direct imaging and Talbot Phase Imaging at the Matter in Extreme Conditions X-ray Imager of LCLS

An endstation for resonant inelastic X-ray scattering studies of solid and liquid samples

BioMAX - the first macromolecular crystallography beamline at MAX IV Laboratory

A Dedicated Superbend X-Ray Microdiffraction Beamline for Materials, Geo-, and Environmental Sciences at the Advanced Light Source

ForMAX – a beamline for multiscale and multimodal structural characterization of hierarchical materials

A facility for the analysis of the electronic structures of solids and their surfaces by synchrotron radiation photoelectron spectroscopy

Development of a compact fast CCD camera and resonant soft x-ray scattering endstation for time-resolved pump-probe experiments

X‐ray beam diagnostics at the MID instrument of the European X‐ray Free‐Electron Laser Facility

Controlled molecule injector for cold, dense, and pure molecular beams at the European x-ray free-electron laser

ForMAX -- a beamline for multiscale and multimodal structural characterization of hierarchical materials