Auger Depth Profile Studies of Diffusion at Iron Phthalocyanine/Copper Phthalocyanine Interfaces

Robert E. Davis,Larry R. Faulkner
DOI: https://doi.org/10.1149/1.2127634
IF: 3.9
1981-06-01
Journal of The Electrochemical Society
Abstract:Elemental depth profiles of thin molecular films have been obtained using Auger electron spectroscopy in conjunction with ion etching by reducing the average electron current density and using a conducting substrate. The minimum observed interface width of CuPc (800Åthick)/FePc (800Åthick) in unannealed samples was approximately 300–400Å. Evidence is presented that this broad interface is due to the microcrystalline morphology of these physically vapor‐deposited molecular solids. Annealing under various conditions has provided insight into the diffusion and consequent degradation of these assemblies, apparently through a grain boundary mechanism.
electrochemistry,materials science, coatings & films
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