Top‐Down Approach to Study Chemical and Electronic Properties of Perovskite Solar Cells: Sputtered Depth Profiling Versus Tapered Cross‐Sectional Photoelectron Spectroscopies

Chittaranjan Das,Waqas Zia,Claudiu Mortan,Navid Hussain,Michael Saliba,Jan Ingo Flege,Małgorzata Kot
DOI: https://doi.org/10.1002/solr.202100298
IF: 9.1726
2021-08-19
Solar RRL
Abstract:A study of the chemical and electronic properties of various layers across perovskite solar cell (PSC) stacks is challenging. Depth-profiling photoemission spectroscopy can be used to study the surface, interface, and bulk properties of different layers in PSCs, which influence the overall performance of these devices. In this study, we use sputter depth profiling (SDP) and tapered cross-section (TCS) photoelectron spectroscopy (PES) to study highly efficient mixed halide PSCs. We find that the most used SDP-PES technique degrades the organic and deforms the inorganic materials during sputtering of the PSCs while the TCS-PES method is less destructive, and can determine the chemical and electronic properties of all layers precisely. The SDP-PES dissociates the chemical bonding in the Spiro-MeOTAD, and perovskite layer and reduces the TiO2, which causes the chemical analysis unreliable. The TCS-PES revealed a band bending only at the Spiro-MeOTAD/perovskite interface of about 0.7 eV. Both the TCS and SDP-PES show that the perovskite layer is inhomogeneous and has higher amount of bromine at the perovskite/TiO2 interface.This article is protected by copyright. All rights reserved.
energy & fuels,materials science, multidisciplinary
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