Data Sampling Algorithm Based on Complexity-Entropy Plane for Smart Sensing Applications

Givanildo L. Nascimento,Cristopher G. S. Freitas,Osvaldo A. Rosso,Andre L. L. Aquino

DOI: https://doi.org/10.1109/jsen.2021.3116548

IF: 4.3

2021-11-15

IEEE Sensors Journal

Abstract:This work proposes a data sampling algorithm for smart cities applications based on sensor network infrastructure. Our algorithm identifies the sensor data behavior through the Causality Complexity-Entropy Plane and performs data reduction by removing redundant data without losing the system's properties. For this, we recognize the systems' dynamic changes in real-time through a delimiter, named Maximum Complexity Point (MCP). Thus, we determine when to update the sampling period to maximize the system's information content, i.e., the statistical complexity quantifier. To confirm the sampling adaptability, we apply our method in three different chaotic attractors: Rossler, Lorenz, and <span class="mjpage"><svg xmlns:xlink="http://www.w3.org/1999/xlink" width="2.818ex" height="2.509ex" style="vertical-align: -0.671ex;" viewBox="0 -791.3 1213.4 1080.4" role="img" focusable="false" xmlns="http://www.w3.org/2000/svg"><g stroke="currentColor" fill="currentColor" stroke-width="0" transform="matrix(1 0 0 -1 0 0)"> <use xlink:href="#MJMATHI-42" x="0" y="0"></use> <use transform="scale(0.707)" xlink:href="#MJMAIN-37" x="1074" y="-213"></use></g></svg></span> . We compared our solution with two other sampling algorithms: (i) random histogram-based sampling and the <span class="mjpage"><svg xmlns:xlink="http://www.w3.org/1999/xlink" width="1.583ex" height="2.176ex" style="vertical-align: -0.338ex;" viewBox="0 -791.3 681.5 936.9" role="img" focusable="false" xmlns="http://www.w3.org/2000/svg"><g stroke="currentColor" fill="currentColor" stroke-width="0" transform="matrix(1 0 0 -1 0 0)"> <use xlink:href="#MJMATHI-4C" x="0" y="0"></use></g></svg></span> algorithm. We use the K-S test, the average Data Error, and the Causality Complexity-Entropy Plane to compare the results. Using our sampling approach, we observed K-S test distances less than 3% for chaotic maps and 1% for natural environments data. The best results were in the Data Error, showing an average error rate up to 13.4% lower when evaluating chaotic data and 15.7% lower when evaluating natural environments. Regarding the dispersion of points in the Causality Complexity-Entropy Plane, the sampled time-series reached regions of higher statistical complexity, indicating that they preserved information content, hence the original data's dynamics.<svg xmlns="http://www.w3.org/2000/svg" style="display: none;"><defs id="MathJax_SVG_glyphs"><path stroke-width="1" id="MJMATHI-42" d="M231 637Q204 637 199 638T194 649Q194 676 205 682Q206 683 335 683Q594 683 608 681Q671 671 713 636T756 544Q756 480 698 429T565 360L555 357Q619 348 660 311T702 219Q702 146 630 78T453 1Q446 0 242 0Q42 0 39 2Q35 5 35 10Q35 17 37 24Q42 43 47 45Q51 46 62 46H68Q95 46 128 49Q142 52 147 61Q150 65 219 339T288 628Q288 635 231 637ZM649 544Q649 574 634 600T585 634Q578 636 493 637Q473 637 451 637T416 636H403Q388 635 384 626Q382 622 352 506Q352 503 351 500L320 374H401Q482 374 494 376Q554 386 601 434T649 544ZM595 229Q595 273 572 302T512 336Q506 337 429 337Q311 337 310 336Q310 334 293 263T258 122L240 52Q240 48 252 48T333 46Q422 46 429 47Q491 54 543 105T595 229Z"></path><path stroke-width="1" id="MJMAIN-37" d="M55 458Q56 460 72 567L88 674Q88 676 108 676H128V672Q128 662 143 655T195 646T364 644H485V605L417 512Q408 500 387 472T360 435T339 403T319 367T305 330T292 284T284 230T278 162T275 80Q275 66 275 52T274 28V19Q270 2 255 -10T221 -22Q210 -22 200 -19T179 0T168 40Q168 198 265 368Q285 400 349 489L395 552H302Q128 552 119 546Q113 543 108 522T98 479L95 458V455H55V458Z"></path><path stroke-width="1" id="MJMATHI-4C" d="M228 637Q194 637 192 641Q191 643 191 649Q191 673 202 682Q204 683 217 683Q271 680 344 680Q485 680 506 683H518Q524 677 524 674T522 656Q517 641 513 637H475Q406 636 394 628Q387 624 380 600T313 336Q297 271 279 198T252 88L243 52Q243 48 252 48T311 46H328Q360 46 379 47T428 54T478 72T522 106T564 161Q580 191 594 228T611 270Q616 273 628 273H641Q647 264 647 262T627 203T583 83T557 9Q555 4 553 3T537 0T494 -1Q483 -1 418 -1T294 0H116Q32 0 32 10Q32 17 34 24Q39 43 44 45Q48 46 59 46H65Q92 46 125 49Q139 52 144 61Q147 65 216 339T285 628Q285 635 228 637Z"></path></defs></svg>

engineering, electrical & electronic,instruments & instrumentation,physics, applied