STM Images of Films Producted at Elevated Temperatures.

Saburo MATSUOKA,Hiroyuki MASUDA,Yuji IKEDA,Kazuhiro AKAIKE,Yasuo OCHI
DOI: https://doi.org/10.1299/kikaia.57.2602
1991-01-01
TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A
Abstract:Scanning tunneling microscope (STM) possesses the atomic resulution. Surface layers such as oxide layer are always produced at elevated temperature in air. Therefore, STM observation of surface layers is usefull to understand the basic mechanisms of damage such as oxidation and creep at elevated temperature. In this study, the oxide layer on nickel and iron, and the sulfer-precipitated layer on iron and SUS 304 steel were observed with STM at room temperature in air. The images of these layers were obtained under the high bias voltage such as 2 V, when compared with the ordinary voltage such as 20 mV. This was explained considering that the layers were semiconductors.
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