In Situ SXS and XAFS Measurements of Electrochemical Interface

Toshihiro Kondo,Takuya Masuda,Kohei Uosaki
DOI: https://doi.org/10.1007/978-3-662-48606-1_7
2015-12-12
Abstract:In this chapter, we focus on structural studies at electrode/electrolyte solution interfaces by means of surface x-ray scattering (SXS) and x-ray absorption fine structure (XAFS) measurements using synchrotron radiation (SR) light as an x-ray source. After describing the importance of these techniques for structural studies at the electrode/electrolyte interface as an introduction, we explain the fundamental principles and experimental methodologies of these techniques. Finally, we describe trends in the development of these techniques and review the latest topics.
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