Abstract:Electron crystallography is a unique technique for structure analysis of crystals too small to be studied by single-crystal X-ray diffraction, even using a synchrotron radiation.Many different structures including the most complicated zeolites and quasicrystal approximants have been solved by electron diffraction (ED) and high-resolution transmission electron microscopy (HRTEM) combined with crystallographic image processing.[1] Even though, electron crystallography is not widely used for structure analysis compared to X-ray diffraction.The main reasons for this are 1) dynamical scattering; 2) incomplete data and 3) the techniques are not feasible and highly skilful operators are needed.The later often requires a long and hard training period.We have developed several new methods to tackle those problems.Dynamical scattering may be reduced when the incident electron beam is tilted off the zone axes.This is achieved in precession electron diffraction (PED).We have developed a new software-based method -the digital sampling method to automatically collect a series of ED frames while the electron beam is precessed.[2]Several different post-processing strategies are developed for extracting the ED data and combining them to a PED pattern.The intensity data obtained by the digital sampling method were used for structure refinement of K 2 O⋅7Nb 2 O 5 .The data quality is shown to be comparable to, and in some cases even better than that obtained using a hardware-based electron precession device.We have combined digital electron beam rotations with goniometer tilts for collecting complete 3D electron diffraction data.[3]A 3D electron diffraction dataset with an tilt range of ± 70° can be collected automatically from a nanosized crystal on a JEOL JEM2100 TEM.More than one thousand electron diffraction patterns can be collected within 1-2 hours, with a step of 0.05° -0.1° for each ED frame.There is no need for pre-alignment of the crystal.The ED patterns are combined into a 3D reciprocal lattice, from which the unit cell parameters and space group can be determined.ED intensities of all reflections can be extracted and used for structure solution and refinement.Diffuse scattering and diffraction streaks caused by crystal defects can be quantified and used for studying the defect structures in the crystals.The power of the new methods for structure analysis is demonstrated on several inorganic structures and zeolites.The automation procedure for collection of complete 3D ED data from nano-sized crystals opens new possibilities and applications of electron diffraction for structure analysis.

Transmission Kikuchi diffraction in a scanning electron microscope: A review

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope

Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors

In-situ Transmission Kikuchi Diffraction Nano-tensile Testing

A new metrology tool: using Transmission Kikuchi Diffraction (TKD) to identify and separate nanoparticles for regulatory purposes

High-Resolution Scanning X-ray Diffraction Microscopy

Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition

Application of scanning electron diffraction in the transmission electron microscope for the characterisation of dislocations in minerals

EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries

Electron diffraction based techniques in scanning electron microscopy of bulk materials

A simple, static and stage mounted direct electron detector based electron backscatter diffraction system

Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review

Dynamical Diffraction of High-Energy Electrons Investigated by Focal Series Momentum-Resolved Scanning Transmission Electron Microscopy at Atomic Resolution.

Transmission-scanning electron microscopy of interface fracture of ferrite deformation twins

Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction

Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEM

Tomographic Diffractive Microscopy: A Review Of Methods And Recent Developments

Comparing Scanning Electron Microscope and Transmission Electron Microscope Grain Mapping Techniques Applied to Well-Defined and Highly Irregular Nanoparticles

Microdiffraction phase identification in the scanning electron microscope (SEM)

Complete 3D Electron Diffraction Data Collection - New Methods and Applications

Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy