3D shape measurement with thermal pattern projection

Anika Brahm,Edgar Reetz,Simon Schindwolf,Martin Correns,Peter Kühmstedt,Gunther Notni
DOI: https://doi.org/10.1515/aot-2016-0052
2016-01-01
Advanced Optical Technologies
Abstract:Abstract Structured light projection techniques are well-established optical methods for contactless and nondestructive three-dimensional (3D) measurements. Most systems operate in the visible wavelength range (VIS) due to commercially available projection and detection technology. For example, the 3D reconstruction can be done with a stereo-vision setup by finding corresponding pixels in both cameras followed by triangulation. Problems occur, if the properties of object materials disturb the measurements, which are based on the measurement of diffuse light reflections. For example, there are existing materials in the VIS range that are too transparent, translucent, high absorbent, or reflective and cannot be recorded properly. To overcome these challenges, we present an alternative thermal approach that operates in the infrared (IR) region of the electromagnetic spectrum. For this purpose, we used two cooled mid-wave (MWIR) cameras (3–5 μm) to detect emitted heat patterns, which were introduced by a CO
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