Abstract:For a century, x-ray crystallography has been conducted with one of the two extreme sample conditions: either a single crystal which produces a single set of diffraction spots directly corresponding to the geometric orientation of the crystal, or a powder sample which comprises a huge number of crystals so numerous that the diffraction spots overlap and merge into smooth rings while the geometric relation is completely lost and only the d-spacings information of diffraction planes is observed. High-pressure DAC is not optimized for either condition. Powder x-ray diffraction has the intrinsic limitations when the sample consists of multiple different phases with low symmetry. Diffraction rings cover most of the detector area, and only a couple of low angle diffraction rings are unique to a phase; most other rings overlap with one another and cannot be used for unique identiﬁcation or accurate determination of crystallographic parameters. New structures and minor phases are often overshadowed by the diffraction of major phases and are impossible to ﬁnd or identify. Advanced crystallographic software, such as Rietveld and LeBail reﬁnement methods, may get most out of a powder pattern, but cannot overcome the intrinsic limitations. In addition, the common practice of integrating the 2D ring into a 1D peak plot throws away the valuable information of a whole dimension, such as the azimuthal angle of diffraction spot around the ring. Single-crystal XRD contains orientation and geometrical relationship in addition to d-spacings and thus provides a deﬁnitive characterization of the unit cell and symmetry. Unless the crystal is orientated exactly relative to the incident monochromatic x-ray beam to satisfy the Bragg relation, the crystal gives no signal, and the detector remains empty. Rotating the crystal around the w-axis (perpendicular to the incident x-ray beam) can bring the crystal to Bragg condition and occasionally obtain single diffraction spots at a given angle and scanning step. In spite of the advantages, single crystal cannot be sustained through phase transitions and often breaks down into multiple crystals and generate spotty XRD patterns. Spottiness, that is generally regarded as a ﬂaw in powder XRD, can be turned into great advantages if we can separate individual crystallites and handle them as individual single crystals. The high-brilliance x-ray beam available at synchrotron facilities has made it possible to collect diffraction spots in a powder sample comprised of up to hundreds of submicron crystallites. The newly developed Multigrain Crystallography (MGC) package, which is a suite of programs used for processing and indexing diffraction spots, has been developed to separate and identify the crystallographic orientation of each individual crystallite in the aggregate of hundreds of crystallites. Once separated, the data set for each crystallite can be handled with the standard single-crystal reﬁnement program identical to a stand-alone single crystal, resulting in excellent statistics in reﬁnement and full coverage of the reciprocal space. The MGC method is very powerful in unequivocal determination of symmetry and unit cells, testing different indexing models, picking out minor phases, and resolving strain of individual crystallites, and will very likely replace the powder and single-crystal x-ray diffraction methods as the dominant crystallographic tool for future high pressure-temperature studies in DAC.

Absorption contrast effects in the quantitative XRD analysis of powders by full multiphase profile refinement

Computer Simulation Of X-Ray Powder Diffraction Pattern

The diffraction power of crystals with unknown atomic structures: calculation and application in quantitative phase analysis

Quantitative Analysis of a Textured Coating by a New X-Ray Diffraction Method

Ab Initio Phasing of X-Ray Powder Diffraction Patterns by Charge Flipping

Quantitative Phase Analysis by X-ray Diffraction—Doping Methods and Applications

Distinguishing and Further Reinforcement for Nanocrystal XRD Peaks Caused by Instrument Broadening in Nanomixed Materials

XRF and XRPD data sets in ternary mixtures with high level micro-absorption and/or preferred orientations problems for phase quantification analysis

Refractive index measurement of pharmaceutical powders in the short-wave infrared range using index matching assisted with phase imaging

Phase Analysis of Portland Cement by Combined Quantitative X-Ray Powder Diffraction and Scanning Electron Microscopy.

Calculating the reference intensity ratio of crystalline phases with unknown atomic arrangements using the lattice parameters and chemical information

Computed depth profile method of X-ray diffraction and its application to Ni/Pd films

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples

Iterative Bragg peak removal on X‐ray absorption spectra with automatic intensity correction

Microcrystalline cellulose (MCC) analysis and quantitative phase analysis of ciprofloxacin/MCC mixtures by Rietveld XRD refinement with physically based background

Quantitative Deviation of Nanocrystals Using the RIR Method in X-ray Diffraction (XRD)

Elemental X-Ray Imaging Using Zernike Phase Contrast

Comparison of Quantitative X-ray Diffraction Mineral Analysis Methods

Using Phases Retrieved from Two-Dimensional Projections to Facilitate Structure Solution from X-Ray Powder Diffraction Data