Deep Learning Assisted Plasmonic Dark-Field Microscopy for Super-Resolution Label-Free Imaging

Ming Lei,Junxiang Zhao,Ayse Z. Sahan,Jie Hu,Junxiao Zhou,Hongki Lee,Qianyi Wu,Jin Zhang,Zhaowei Liu
DOI: https://doi.org/10.1021/acs.nanolett.4c04399
IF: 10.8
2024-11-28
Nano Letters
Abstract:Dark-field microscopy (DFM) is a widely used imaging tool, due to its high-contrast capability in imaging label-free specimens. Traditional DFM requires optical alignment to block the oblique illumination, and the resolution is diffraction-limited to the wavelength scale. In this work, we present deep-learning assisted plasmonic dark-field microscopy (DAPD), which is a single-frame super-resolution method using plasmonic dark-field (PDF) microscopy and deep-learning assisted image...
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
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